View M3851005503BEA_1235584.PDF datasheet online --- IC-ON-LINE

Datasheet File OCR Text:

mil-m-38510/55g 22 february 2005 superseding mil-m-38510/55f 30 april 1984 military specification microcircuits, digital, cmos, buffer/converter, true/compliment buffer, monolithic silicon this specification is approved for use by all departments and agencies of the department of defense. the requirements for acquiring the product herein cons ists of this specificat ion sheet and mil-prf 38535 1. scope 1.1 scope. this specification covers the detail requirements for monolithic silicon, cmos, logic microcircuits. two product assurance classes and a choice of case outli nes, lead finishes, and radiation hardness assurance (rha) are provided and are reflected in the complete part or i dentifying number (pin). for this product, the requirements of mil-m-38510 have been superseded by mil-prf-38535 (see 6.3). 1.2 part or identifying number (pin) . the pin is in accordance with mil-prf-38535 and as specified herein. 1.2.1 device types. the device types are as follows: device type circuit 01 and 03 inverting hex buffer 02 and 04 noninverting hex buffer 05 quad true/compliment buffer 51 and 53 inverting hex buffer 52 and 54 noninverting hex buffer 55 quad true/compliment buffer 1.2.2 device class. the device class is the product assu rance level as defined in mil-prf-38535. 1.2.3 case outlines. the case outlines are as designated in mil-std-1835 and as follows: outline letter descriptive designator terminals package style a gdfp5-f14 or cdfp6-f14 14 flat pack c gdip1-t14 or cdip2-t14 14 dual-in-line d gdfp1-f14 or cdfp2-f14 14 flat pack e gdip1-t16 or cdip2-t16 16 dual-in-line f gdfp2-f16 or cdfp3-f16 16 flat pack n cdfp4-f16 16 flat pack t cdfp3-f14 14 flat pack x 1 / 2 / gdfp5-f14 or cdfp6-f14 14 flat pack, except a dimension equals 0.100? (2.54 mm) max y 1 / 2 / gdfp1-f14 or cdfp2-f14 14 flat pack, except a dimension equals 0.100? (2.54 mm) max z 1 / 2 / gdfp2-f16 or cdfp3-f16 16 flat pack, except a dimension equals 0.100? (2.54 mm) max 1 / as an exception to nickel plate or under coating paragraphs of mil-prf-38535, appendix a, for case outlines x, y, and z only, the leads of bottom brazed ceramic pa ckages (i.e., configuration 2 of case outli nes a, d, or f) may have electroless nickel undercoating which is 50 to 200 microinches (1.27 to 5.08 m) thick provided the lead fini sh is hot solder dip (i.e., finish letter a) and provided that, after any lead forming, an addi tional hot solder dip coating is applied which extends from the outer tip of the lead to no more than 0.015 inch (0.38 mm) from the package edge. 2 / for bottom or side brazed packages, case outlines x, y, and z only, the s 1 dimension may go to .000 inch (.00 mm) minimum. comments, suggestions, or questions on this docum ent should be addressed to: commander, defense supply center columbus, attn: dscc-vac, p.o. box 3990, columbus, oh 43218-3990, or email cmos@dscc.dla.mil . since contact information can change, you may want to verify the currency of this address information using the assist online database at http://assist.daps.dla.mil . amsc n/a fsc 5962 inch-pound reactivated after 22 february 2005 and may be used for new and existing designs and acquisitions.
mil-m-38510/55g 2 1.3 absolute maximum ratings . device types 01 and 02 supply voltage range (v dd - v ss ): v cc v dd ......................................................................................... -0.5 v to +15.5 v output load capacitance (e ach output) .............................................. 200 pf when v cc > 10 v dc input voltage range ........................................................................... (v ss - 0.5 v) v i (v dd + 0.5 v) device types 51 and 52 supply voltage range (v dd - v ss ): v cc v dd ......................................................................................... -0.5 v to +18.0 v output load capacitance (e ach output) .............................................. 200 pf when v cc > 10 v dc input voltage range ........................................................................... (v ss - 0.5 v) v i (v dd + 0.5 v) dc output source or sink current per pin........................................... i oh = -0.4 ma i ol = +12.0 ma dc supply current, per pin (i dd , i cc ) .................................................. -25.0 ma dc ground current, per pin (i gnd ) ...................................................... + 50.0 ma device types 03 and 04 supply voltage range (v cc - v ss )....................................................... -0.5 v to +15.5 v input voltage range ........................................................................... (v ss - 0.5 v) v i (v dd + 0.5 v) device types 53 and 54 supply voltage range (v dd - v ss )....................................................... -0.5 v to +18.0 v input voltage range ........................................................................... (v ss - 0.5 v) v i (v dd + 0.5 v) dc output source or sink current per pin........................................... i oh or i ol = 12.0 ma dc supply current or ground current, per pin (i cc , i gnd ) .................... 50.0 ma device type 05 supply voltage range (v dd - v ss )....................................................... -0.5 v to +15.0 v input voltage range ........................................................................... (v ss - 0.5 v) v i (v dd + 0.5 v) device type 55 supply voltage range (v dd - v ss )....................................................... -0.5 v to +18.0 v input voltage range ........................................................................... (v ss - 0.5 v) v i (v dd + 0.5 v) dc output source or sink current per pin: true comp liment ............................................................................. i oh or i ol = 12.0 ma compliment output .......................................................................... i oh or i ol = 6.0 ma dc supply or ground current, per pin (i dd , i gnd ) ................................ 50.0 ma all device types input current (e ach input ) .................................................................. 10 ma storage temperature range (t stg ).................................................... -65 to +175 c maximum power dissipation (p d ) ...................................................... 200 mw lead temperature (soldering, 10 se conds) ....................................... +300 c thermal resistance, junction to case ( jc )......................................... see mi l-std-1835 junction temperature (t j ) ................................................................. 175 c
mil-m-38510/55g 3 1.4 recommended operating conditions . supply voltage range (v cc or v dd - v ss ): device types 01, 02, 03, 04, and 05 ..................................... 4.5 v dc to 12.5 v dc device types 51, 52, 53, 54, and 55 ..................................... 4.5 v dc to 15.0 v dc input low voltage range (v il ): device types 01, 02, 03, 04, and 05 ..................................... 0.0 v to 0.85 v dc @ v cc or v dd = 5.0 v dc 0.0 v to 2.1 v dc @ v cc or v dd = 12.5 v dc device types 51, 52, 53, 54, and 55 ..................................... v ol = 10% v cc or v dd , v oh = 90% v cc or v dd 0.0 v to 1.5 v dc @ v cc or v dd = 5.0 v dc 0.0 v to 2.0 v dc @ v cc or v dd = 10.0 v dc 0.0 v to 4.0 v dc @ v cc or v dd = 15.0 v dc input high voltage range (v ih ): 1 / device types 01, 02, 03, 04, and 05 ..................................... 3.95 v to 5.0 v dc @ v cc or v dd = 5.0 v dc 10 v to 12.5 v dc @ v cc or v dd = 12.5 v dc device types 51, 52, 53, 54, and 55 ..................................... v ol = 10% v cc or v dd , v oh = 90% v cc or v dd 3.5 v to 5.0 v dc @ v cc or v dd = 5.0 v dc 8.0 v to 10.0 v dc @ v cc or v dd = 10.0 v dc 11.0 v to 15.0 v dc @ v cc or v dd = 15.0 v dc load capacita nce ................................................................... 50 pf maximum case operating temperature range (t c ) ................................ -55 c to +125 c 2. applicable documents 2.1 general . the documents listed in this section are specified in sections 3, 4, or 5 of th is specification. this section does not include documents cited in other sectio ns of this specification or recommended for additional information or as examples. while every effort has bee n made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements of documents ci ted in sections 3, 4, or 5 of this specification, whether or not they are listed. 2.2 government documents . 2.2.1 specificat ions and standards . the following specifications and standar ds form a part of this specification to the extent specified herein. unless otherwise specified, the issues of these documents are t hose cited in the solicitation or contract. department of defe nse specification mil-prf-38535 - integrated circuits (microcircu its) manufacturing, gener al specification for. department of defense standards mil-std-883 - test method standard microcircuits. mil-std-1835 - interface standard el ectronic component case outlines . (copies of these document s are available online at http://assist.daps.dla .mil/quicksearch/ or http://assist.daps.dla.mil/ or from the standardization document or der desk, 700 robbins avenue, building 4d, philadelphia, pa 19111-5094.) 2.3 order of precedence . in the event of a conflict between the text of this document and the references cited herein, the text of this document takes precedence. noth ing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1 / the input high voltage (v ih) can exceed the power supply voltage (v cc ) up to the maximum rating when device types 03, 04, 53, and 54 are used for logic level conversion.
mil-m-38510/55g 4 3. requirements 3.1 qualification . microcircuits furnished under this specificati on shall be products that are manufactured by a manufacturer authorized by the qualifying activity for listi ng on the applicable qualifi ed manufacturers list before contract award (see 4.3 and 6.4). 3.2 item requirements . the individual item requirements shall be in accordance with mil-prf-38535 and as specified herein or as modified in the device manufacture r's quality management (qm) plan. the modification in the qm plan shall not affect the form, fit, or function as described herein. 3.3 design, construction, and physical dimensions. the design, construction, and physical dimensions shall be as specified in mil-prf-38535 and herein. although eutect ic die bonding is preferred, epoxy die bonding may be performed. however, the resin used shall be dupont 5504 con ductive silver paste, or equivalent, which is cured at 200 c 10 c for a minimum of 2 hours. the use of equivalent epoxies or cure cycles shall be approved by the qualifying activity. equivalency shall be demonstrated in data submitted to the qualifying activity for verification. 3.3.1 logic diagram and terminal connections. the logic diagram and terminal connections shall be as specified on figure 1. 3.3.2 truth tables and logic equations . the truth tables and logic equations shall be as specified on figure 2. 3.3.3 switching time test circuit and waveforms . the switching time test circuit and waveforms shall be as specified on figure 3. 3.3.4 schematic circuits. the schematic circuits shall be maintained by the manufacturer and made available to the qualifying activity or preparing activity upon request. 3.3.5 case outlines. the case outlines shall be as specified in 1.2.3. 3.4 lead material and finish. the lead material and finish shall be in accordance with mil-prf-38535 (see 6.6). 3.5 electrical performance characteristics . unless otherwise specified, the el ectrical performance characteristics are as specified in table i, and apply over the fu ll recommended case operating temperature range. 3.6 electrical test requirements. the electrical test requirements fo r each device class shall be the subgroups specified in table ii. the electrical tests for each subgroup are described in table iii. 3.7 marking. marking shall be in accordance with mil-prf-38535. 3.7.1 radiation hardness assurance identifier . the radiation hardness assurance identifier shall be in accordance with mil-prf-38535 and 4.5.4 herein. 3.8 microcircuit group assignment. the devices covered by this specification shall be in microcircuit group number 37 (see mil-prf-38535, appendix a).
mil-m-38510/55g 5 table i. electrical performance characteristics . limits test symbol conditions -55 c t c +125 c, v ss = 0 v unless otherwise specified device type 1 / min max unit positive clamping input to v dd or v cc v ic(pos) t c = 25 c, v dd and v cc = gnd, v ss = open, output = open, i i = 1 ma 01, 02, 05, 51, 52, 55 +1.5 v dc negative clamping input to v ss v ic(neg) t c = 25 c, v dd and v cc = open, v ss = gnd, output = open, i i = -1 ma all -6.0 v dc v dd and v cc = 15 v dc, any combination of inputs 01-05 -750 quiescent supply current i ss v dd and v cc = 18 v dc, any combination of inputs 51-55 -750 na dc v oh1 v dd and v cc = 4.5 v dc, i oh = -0.1 ma (see table iii) 01-05 2.50 v oh2 v dd and v cc = 5 v dc, i oh = -0.35 ma (see table iii) 01-05 4.5 v oh3 v dd and v cc = 5 v dc, i oh = 0.0 ma (see table iii) 01-05 4.95 v oh4 v dd and v cc = 12.5 v dc, i oh = 0.0 ma (see table iii) 01-05 11.25 high level output voltage v oh5 v dd and v cc = 15 v dc, i oh = 0.0 ma (see table iii) 51-55 14.95 v dc v ol1 v dd and v cc = 5.5 v dc, i ol = 0.23 ma (see table iii) 01-05 0.5 v ol2 v dd and v cc = 5 v dc, i ol = 2.1 ma (see table iii) 01-05 0.5 v ol3 v dd and v cc = 5 v dc, i ol = 0.0 ma (see table iii) 01-05 0.05 v ol4 v dd and v cc = 12.5 v dc, i ol = 0.0 ma (see table iii) 01-05 1.25 low level output voltage v ol5 v dd and v cc = 15 v dc, i ol = 0.0 ma (see table iii) 51-55 0.05 v dc 51, 53 4.0 v ih1 v dd and v cc = 5 v dc v o = (see table iii), ? i o ? 1 a 52, 54, 55 3.5 v dc 51, 53 8.0 v ih2 v dd and v cc = 10 v dc v o = (see table iii), ? i o ? 1 a 52, 54, 55 7.0 v dc 51, 53 12.0 input high voltage v ih3 v dd and v cc = 15 v dc v o = (see table iii), ? i o ? 1 a 52, 54, 55 11.0 v dc see footnote at end of the table.
mil-m-38510/55g 6 table i. electrical performance characteristics ? continued. limits unit test symbol conditions -55 c t c +125 c, v ss = 0 v unless otherwise specified device type 1 / min max 51, 53 1.0 v il1 v dd and v cc = 5 v dc v o = (see table iii), ? i o ? 1 a 52, 54, 55 1.5 v dc 51, 53 2.0 v il2 v dd and v cc = 10 v dc v o = (see table iii), ? i o ? 1 a 52, 54, 55 3.0 v dc 51, 53 2.5 input low voltage v il3 v dd and v cc = 15 v dc v o = (see table iii), ? i o ? 1 a 52, 54, 55 4.0 v dc v dd and v cc = 5 v dc v in = (see table iii), v ol = 0.4 v dc 51-54 2.2 true output 1.2 i ol1 compliment output 55 0.55 ma dc v dd and v cc = 15 v dc v in = (see table iii) v ol = 1.5 v dc 51-54 17.0 true output 8.0 output low (sink) current i ol2 compliment output 55 3.0 ma dc v dd and v cc = 5 v dc v in = (see table iii) v oh = 4.6 v dc 51-54 -0.36 true output -1.0 i oh1 compliment output 55 -0.4 ma dc v dd and v cc = 15 v dc v in = (see table iii) v oh = 13.5 v dc 51-54 -2.4 true output -6.0 output high (source) current i oh2 compliment output 55 -2.7 ma dc v dd and v cc = 15 v dc 01-05 100.0 input leakage current, high i ih v dd and v cc = 18 v dc 51-55 100.0 na v dd and v cc = 15 v dc 01-05 -100.0 input leakage current, low i il v dd and v cc = 18 v dc 51-55 -100.0 na 01, 03, 05, 51, 53, 55 20 input capacitance c i v dd and v cc = 0 v dc f = 1 mhz t c = 25 c 02, 04, 52, 54 12 pf see footnote end of table.
mil-m-38510/55g 7 table i. electrical performance characteristics ? continued. limits unit test symbol conditions -55 c t c +125 c, v ss = 0 v unless otherwise specified device type 1 / min max 01, 02, 51, 52 6.0 150 03, 04, 53, 54 6.0 225 propagation delay time, high to low level t phl v dd and v cc = 5 v dc c l = 50 pf (see figure 3) 05, 55 6.0 172 ns 01, 02, 51, 52 6.0 210 03, 04, 53, 54 6.0 345 propagation delay time, low to high level t plh v dd and v cc = 5 v dc c l = 50 pf (see figure 3) 05, 55 6.0 188 ns 01, 02, 51, 52 6.0 90 03, 04 53, 54 6.0 105 transition time, high to low level t thl v dd and v cc = 5 v dc c l = 50 pf (see figure 3) 05, 55 6.0 165 ns 01, 02, 03, 04, 51, 52, 53, 54 6.0 405 transition time, low to high level t tlh v dd and v cc = 5 v dc c l = 50 pf (see figure 3) 05, 55 6.0 180 ns 1 / device types 01, 02, 51, and 52 have both v cc and v dd terminals. device types 03, 04, 53, and 54 have only a v cc terminal. device types 05 and 55 have only a v dd terminal.
mil-m-38510/55g 8 note: terminal 16 is not connected for device types 03, 04, 53, and 54. figure 1. logic diagrams and terminal connections .
mil-m-38510/55g 9 figure 1. logic diagrams and terminal connections ? continued.
mil-m-38510/55g 10 device types 01, 03, 51, and 53 input output a y l h h l positive logic: y = a device types 02, 04, 52, and 54 input output a y l l h h positive logic: y = a device types 05 and 55 input output a y y l l h h h l positive logic: y = a h = high level voltage l = low level voltage figure 2. truth tables and logic equations .
mil-m-38510/55g 11 notes: 1. the pulse generator has the following characteristics: v gen = v dd 1%, t ph = 1.0 0.1 s, t r = t f = 10 2 ns, and prr = 200 khz. 2. see table iii for comp lete terminal conditions. figure 3. switching time test circuit and waveforms .
mil-m-38510/55g 12 4. verification 4.1 sampling and inspection. sampling and inspection procedures shall be in accordance with mil-prf-38535 or as modified in the device manufacturer's quality mana gement (qm) plan. the modification in the qm plan shall not affect the form, fit, or function as described herein. 4.2 screening. screening shall be in accordance with mil-prf-38535 and shall be conducted on all devices prior to qualification and conformance inspection. t he following additional criteria shall apply: a. the burn-in test duration, test condition, and test temperature, or approved alternatives shall be as specified in the device manufacturer's qm plan in a ccordance with mil-prf-38535. the burn-in test circuit shall be maintained under document control by the device manufacturer's technology review board (trb) in accordance with mil-prf-38535 and shall be made available to the acquiring or preparing activity upon request. the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the in tent specified in test me thod 1015 of mil-std-883. b. delete the sequence specified as interim (pre-burn- in) electrical parameters through interim (post-burn-in) electrical parameters of table ia of mil-prf-38535 and substitute lines 1 through 7 of table ii herein. c. burn-in (method 1015 of mil-std-883). (1) unless otherwise specified in the manufacturers qm plan for static tests (test condition a), ambient temperature (t a ) shall be +125 c minimum. test duration for each static test shall be 24 hours minimum for class s devices and in accordance with table i of method 1015 for class b devices. i. for static burn-in i, all inpu ts shall be connected to 0.0 v. ii. for static burn-in ii, all inputs shall be connected to v dd . iii. except for v dd and v ss , the terminal shall be connected through resistors whose value is 2 k ? to 47 k ? . the actual measured value of the resistor selected shall not exceed 20% of its branded value du e to use, heat or age. iv. output may be open or connected to v dd /2. v. v dd = 12.5 v minimum, 15 v maximum for device types 01, 02, 03, 04, and 05. v dd = 15 v minimum, 18 v maximum for device types 51, 52, 53, 54, and 55. v dd /2 = v dd /2 1.0 v for all devices. v ss = 0.0 v. (2) unless otherwise specified in the manufacturers qm plan for dynamic test (test condition d), ambient temperature shall be +125 c minimum. test duration shall be in accordance with table i of method 1015. i. except for v dd and v ss , the terminals shall be connected through resistors whose value is 2 k ? to 47 k ? . the actual measured value of the resistor selected shall not exceed 20% of its branded value du e to use, heat or age. ii. input signal requirements: square wave , 50% duty cycle; 25 khz < prr < 1 mhz; t tlh and t thl < 1 s. voltage level: minimum = v ss ? 0.5 v, +10% v dd ; maximum = v dd + 0.5 v, -10% v dd . iii. v dd = 12.5 v minimum, 15 v maximum for device types 01, 02, 03, 04, and 05. v dd = 15 v minimum, 18 v maximum for device types 51, 52, 53, 54, and 55. v dd /2 = v dd /2 1.0 v for all devices. v ss = 0.0 v.
mil-m-38510/55g 13 d. interim and final electrical test par ameters shall be as specified in table ii. e. for class s devices, post dynamic burn-in, or cl ass b devices, post static burn-in, electrical parameter measurements may, at the manufacturer?s option, be performed separately or included in the final electrical parameter requirements. table ii. electrical test requirements. class s device 1 / class b device 1 / line no. mil-prf-38535 test requirements ref. par. table iii subgroups 2 / table iv delta limits 3 / ref. par. table iii subgroups 2 / table iv delta limits 3 / 1 interim electrical parameters 1 1 2 static burn-in i (method 1015) 4.2c 4.5.2 3 same as line 1 1 ? 4 static burn-in ii (method 1015) 4.2c 4.5.2 4.2c 4.5.2 4 / 5 same as line 1 4.2e 1* ? 4.2e 1* ? 6 dynamic burn-in (method 1015) 4.2c 4.5.2 7 same as line 1 4.2e 1* ? 8 final electrical parameters (method 5004) 1*, 2, 3, 9 1*, 2, 3, 9 9 group a test requirements (method 5005) 4.4.1 1, 2, 3, 4, 9, 10, 11 4.4.1 1, 2, 3, 4, 9, 10, 11 10 group b test when using method 5005 qci option 4.4.2 1, 2, 3, 9, 10, 11 ? 11 group c end- point electrical parameters (method 5005) 4.4.3 1, 2, 3 ? 12 group d end- point electrical parameters (method 5005) 4.4.4 1, 2, 3 4.4.4 1, 2, 3 1 / blank spaces indicate tests are not applicable. 2 / * indicates pda applies to subgroup 1 (see 4.2.1). 3 / ? indicates delta limits shall be requir ed only on table iii subgroup 1, where specified, and t he delta values shall be computed with reference to the prev ious interim electrical parameters. 4 / the device manufacturer may at his option either perform delta measurements or within 24 hours after burn-in (or removal of bias) perform the final electrical parameter measurements.
mil-m-38510/55g 14 4.2.1 percent defective allowable (pda) . a. the pda for class s devices shall be 5 percent fo r static burn-in and 5 percent for dynamic burn-in, based on the exact number of devices submitted to each separate burn-in. b. static burn-in i and ii failure shall be cumulative for determining the pda. c. the pda for class b devices shall be in accordan ce with mil-prf-38535 for static burn-in. dynamic burn-in is not required. d. those devices whose measured characteristics, after burn-in, exceed the specified delta ( ? ) limits or electrical parameter limits specifie d in table iii, subgroup 1, are defec tive and shall be removed from the lot. the verified failures divided by the total number of devices in the lot initially submitted to burn-in shall be used to determine the percent defective for the lot and the lot shall be accepted or rejected based on the specified pda. 4.3 qualification inspection. qualification inspection shall be in accordance with mil-prf-38535. 4.3.1 qualification extension . when authorized by the qualifying activity , if a manufacturer qualifies to a 51-55, which is manufactured identically to a 01 - 05 device type on this specification, t hen the 01- 05 device type may be part i qualified by conducting only group a electrical tests and any electrical tests specified as additional group c subgroups and submitting data in accordance with mil-prf-38535. 4.4 technology conformance inspection (tci). technology conformance inspection shall be in accordance with mil-prf-38535 and herein for groups a, b, c, d, and e inspections (see 4.4.1 through 4.4.5). 4.4.1 group a inspection. group a inspection shall be in accordan ce with table iii of mil-prf-38535 and as follows: a. tests shall be performed in accordance with table ii herein. b. subgroups 5, 6, 7, and 8 of table i of method 5005 of mil-std-883 shall be omitted. c. subgroup 4 (c i measurement) shall be measured only for init ial qualification and after process or design changes that may affect input capacitance. ca pacitance shall be measured between the designated terminal and v ss at a frequency of 1 mhz. d. subgroups 9 and 11 shall be measured only for initia l qualification and after process or design changes which may affect dynamic performance. e. when device types 01 through 05 are qualified by extension (see 4.3.1), these device types will be inspected (qci) according to the requirements for device types 51 through 55, respectively. 4.4.2 group b inspection. group b inspection shall be in accordance with table ii of mil-prf-38535. 4.4.3 group c inspection. group c inspection shall be in accordance with table iv of mil-prf-38535 and as follows: a. end-point electrical parameters shall be as specifi ed in table ii herein. delta limits shall apply only to subgroup 1 of group c inspection and shall consis t of tests specified in table iv herein. b. the steady-state life test duration, test condition, and test temperatur e, or approved alternatives shall be as specified in the device manufacturer's qm plan in accordance with mil-prf-38535. the burn-in test circuit shall be maintained under document control by the device manufacturer's technology review board (trb) in accordance with mil-prf-38535 and shall be made available to the acquiring or preparing activity upon request. the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the in tent specified in test me thod 1005 of mil-std-883. c. when device types 01 through 05 are qualified by extension (see 4.3.1), these device types will be inspected (qci) according to the requirements for device types 51 through 55, respectively.
table iii. group a inspection for device types 01 and 03 . for terminal conditions and limits, see 1 / and 2 / test limits cases e,f,n, z 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 3 / subgroup 1 t c = 25 c subgroup 2 t c = 125 c subgroup 3 t c = -55 c symbol mil- std- 883 method test no. v cc y1 a1 y2 a2 y3 a3 v ss a4 y4 a5 y5 nc a6 y6 v dd measured terminal min max min max min max unit v ic(pos) ? ? ? ? ? see 4 / 1 2 3 4 5 6 gnd ? ? ? ? ? 1ma 1ma 1ma 1ma 1ma 1ma gnd ? ? ? ? ? a1 a2 a3 a4 a5 a6 1.5 ? ? ? ? ? vdc ? ? ? ? ? v ic(neg) ? ? ? ? ? 7 8 9 10 11 12 -1ma -1ma -1ma gnd ? ? ? ? ? -1ma -1ma -1ma a1 a2 a3 a4 a5 a6 -6 ? ? ? ? ? ? ? ? ? ? ? i ss i ss 3005 see 5 / 13 14 15.0v 15.0v 15.0v gnd 15.0v gnd 15.0v gnd ? ? 15.0v gnd 15.0v gnd 15.0v gnd 15.0v 15.0v v ss v ss -75 -75 -750 -750 na na v oh1 ? ? ? ? ? 3006 ? ? ? ? ? 15 16 17 18 19 20 4.5v ? ? ? ? ? i oh1 v il1 i oh1 v il1 i oh1 v il1 ? ? ? ? ? ? v il1 i oh1 v il1 i oh1 v il1 i oh1 4.5v ? ? ? ? ? y1 y2 y3 y4 y5 y6 2.5 ? ? ? ? ? 2.5 ? ? ? ? ? 2.5 ? ? ? ? ? vdc ? ? ? ? ? v oh2 ? ? ? ? ? ? ? ? ? ? ? 21 22 23 24 25 26 5.0v ? ? ? ? ? i oh2 v il1 i oh2 v il1 i oh2 v il1 ? ? ? ? ? ? v il1 i oh2 v il1 i oh2 v il1 i oh2 5.0v ? ? ? ? ? y1 y2 y3 y4 y5 y6 4.5 ? ? ? ? ? 4.5 ? ? ? ? ? 4.5 ? ? ? ? ? ? ? ? ? ? ? v oh3 ? ? ? ? ? ? ? ? ? ? ? 27 28 29 30 31 32 ? ? ? ? ? ? v il1 v il1 v il1 ? ? ? ? ? ? v il1 v il1 v il1 ? ? ? ? ? ? y1 y2 y3 y4 y5 y6 4.95 ? ? ? ? ? 4.95 ? ? ? ? ? 4.95 ? ? ? ? ? ? ? ? ? ? ? v oh4 ? ? ? ? ? ? ? ? ? ? ? 33 34 35 36 37 38 12.5v ? ? ? ? ? v il2 v il2 v il2 ? ? ? ? ? ? v il2 v il2 v il2 12.5v ? ? ? ? ? y1 y2 y3 y4 y5 y6 11.25 ? ? ? ? ? 11.25 ? ? ? ? ? 11.25 ? ? ? ? ? ? ? ? ? ? ? v ol1 ? ? ? ? ? 3007 ? ? ? ? ? 39 40 41 42 43 44 5.5v ? ? ? ? ? i ol1 v ih1 i ol1 v ih1 i ol1 v ih1 ? ? ? ? ? ? v ih1 i ol1 v ih1 i ol1 v ih1 i ol1 5.5v ? ? ? ? ? y1 y2 y3 y4 y5 y6 0.5 ? ? ? ? ? 0.5 ? ? ? ? ? 0.5 ? ? ? ? ? ? ? ? ? ? ? see footnotes at end of device type 05. 15 mil-m-38510/55g
table iii. group a inspection for device types 01 and 03 ? continued. for terminal conditions and limits, see 1 / and 2 / test limits cases e,f,n, z 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 3 / subgroup 1 t c = 25 c subgroup 2 t c = 125 c subgroup 3 t c = -55 c symbol mil- std- 883 method test no. v cc y1 a1 y2 a2 y3 a3 v ss a4 y4 a5 y5 nc a6 y6 v dd measured terminal min max min max min max unit v ol2 ? ? ? ? ? 3007 ? ? ? ? ? 45 46 47 48 49 50 5.0v ? ? ? ? ? i ol2 v ih1 i ol2 v ih1 i ol2 v ih1 gnd ? ? ? ? ? v ih1 i ol2 v ih1 i ol2 v ih1 i ol2 5.0v ? ? ? ? ? y1 y2 y3 y4 y5 y6 0.5 ? ? ? ? ? 0.5 ? ? ? ? ? 0.5 ? ? ? ? ? vdc ? ? ? ? ? v ol3 ? ? ? ? ? ? ? ? ? ? ? 51 52 53 54 55 56 ? ? ? ? ? ? v ih1 v ih1 v ih1 ? ? ? ? ? ? v ih1 v ih1 v ih1 ? ? ? ? ? ? y1 y2 y3 y4 y5 y6 0.05 ? ? ? ? ? 0.05 ? ? ? ? ? 0.05 ? ? ? ? ? ? ? ? ? ? ? v ol4 ? ? ? ? ? ? ? ? ? ? ? 57 58 59 60 61 62 12.5v ? ? ? ? ? v ih2 v ih2 v ih2 ? ? ? ? ? ? v ih2 v ih2 v ih2 12.5v ? ? ? ? ? y1 y2 y3 y4 y5 y6 1.25 ? ? ? ? ? 1.25 ? ? ? ? ? 1.25 ? ? ? ? ? ? ? ? ? ? ? i ih1 6 / 3010 63 15.0v 15.0v 15.0v 15.0v ? 15.0v 15.0v 15.0v 15.0v all inputs together 600 na i ih2 ? ? ? ? ? ? ? ? ? ? ? 64 65 66 67 68 69 ? ? ? ? ? ? 15.0v gnd ? ? ? ? gnd 15.0v gnd ? ? ? gnd gnd 15.0v gnd ? ? ? ? ? ? ? ? gnd gnd gnd 15.0v gnd ? gnd ? ? ? 15.0v gnd gnd ? ? ? ? 15.0v ? ? ? ? ? ? a1 a2 a3 a4 a5 a6 100.0 ? ? ? ? ? 100.0 ? ? ? ? ? ? ? ? ? ? ? i il1 6 / 3009 70 ? ? ? ? ? ? ? gnd ? all inputs together -600 ? i il2 ? ? ? ? ? ? ? ? ? ? ? 71 72 73 74 75 76 ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? a1 a2 a3 a4 a5 a6 -100.0 ? ? ? ? ? -100.0 ? ? ? ? ? ? ? ? ? ? ? subgroup 4 t c = 25 c min max c i ? ? ? ? ? 3012 ? ? ? ? ? 77 78 79 80 81 82 gnd ? ? ? ? ? a 7 / a 7 / a 7 / gnd ? ? ? ? ? a 7 / a 7 / a 7 / gnd ? ? ? ? ? a1 a2 a3 a4 a5 a6 20 ? ? ? ? ? pf ? ? ? ? ? see footnotes at end of device type 05. 16 mil-m-38510/55g
table iii. group a inspection for device types 01 and 03 ? continued. for terminal conditions and limits, see 1 / and 2 / test limits cases e,f,n, z 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 3 / subgroup 9 t c = 25 c subgroup 10 t c = 125 c subgroup 11 t c = -55 c symbol mil- std- 883 method test no. v cc y1 a1 y2 a2 y3 a3 v ss a4 y4 a5 y5 nc a6 y6 v dd measured terminal min max 8 / min max 8 / min max 8 / unit t phl ? ? ? ? ? 3003 fig. 3 ? ? ? ? 83 84 85 86 87 88 5.0v ? ? ? ? ? out in out in out in gnd ? ? ? ? ? in out in out in out 5.0v ? ? ? ? ? a1 to y1 a2 to y2 a3 to y3 a4 to y4 a5 to y5 a6 to y6 6 ? ? ? ? ? 100/ 150 ? ? ? ? 9 ? ? ? ? ? 150/ 225 ? ? ? ? 6 ? ? ? ? ? 100/ 150 ? ? ? ? ns ? ? ? ? ? t plh ? ? ? ? ? ? ? ? ? ? ? 89 90 91 92 93 94 ? ? ? ? ? ? out in out in out in ? ? ? ? ? ? in out in out in out ? ? ? ? ? ? a1 to y1 a2 to y2 a3 to y3 a4 to y4 a5 to y5 a6 to y6 6 ? ? ? ? ? 140/ 230 ? ? ? ? 9 ? ? ? ? ? 210/ 345 ? ? ? ? 6 ? ? ? ? ? 140/ 230 ? ? ? ? ? ? ? ? ? ? t thl ? ? ? ? ? 3004 fig. 3 ? ? ? ? 95 96 97 98 99 100 ? ? ? ? ? ? out in out in out in ? ? ? ? ? ? in out in out in out ? ? ? ? ? ? y1 y2 y3 y4 y5 y6 6 ? ? ? ? ? 60/70 ? ? ? ? ? 9 ? ? ? ? ? 90/ 105 ? ? ? ? 6 ? ? ? ? ? 60/70 ? ? ? ? ? ? ? ? ? ? ? t tlh ? ? ? ? ? ? ? ? ? ? ? 101 102 103 104 105 106 ? ? ? ? ? ? out in out in out in ? ? ? ? ? ? in out in out in out ? ? ? ? ? ? y1 y2 y3 y4 y5 y6 6 ? ? ? ? ? 270 ? ? ? ? ? 9 ? ? ? ? ? 405 ? ? ? ? ? 6 ? ? ? ? ? 270 ? ? ? ? ? ? ? ? ? ? ? see footnotes at end of device type 05. 17 mil-m-38510/55g
table iii. group a inspection for device types 02 and 04 . for terminal conditions and limits, see 1 / and 2 / test limits cases e,f,n, z 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 3 / subgroup 1 t c = 25 c subgroup 2 t c = 125 c subgroup 3 t c = -55 c symbol mil- std- 883 method test no. v cc y1 a1 y2 a2 y3 a3 v ss a4 y4 a5 y5 nc a6 y6 v dd measured terminal min max min max min max unit v ic(pos) ? ? ? ? ? see 4 / 1 2 3 4 5 6 gnd ? ? ? ? ? 1ma 1ma 1ma 1ma 1ma 1ma gnd ? ? ? ? ? a1 a2 a3 a4 a5 a6 1.5 ? ? ? ? ? vdc ? ? ? ? ? v ic(neg) ? ? ? ? ? 7 8 9 10 11 12 -1ma -1ma -1ma gnd ? ? ? ? ? -1ma -1ma -1ma a1 a2 a3 a4 a5 a6 -6 ? ? ? ? ? ? ? ? ? ? ? i ss i ss 3005 see 5 / 13 14 15.0v 15.0v 15.0v gnd 15.0v gnd 15.0v gnd ? ? 15.0v gnd 15.0v gnd 15.0v gnd 15.0v 15.0v v ss v ss -75 -75 -750 -750 na na v oh1 ? ? ? ? ? 3006 ? ? ? ? ? 15 16 17 18 19 20 4.5v ? ? ? ? ? i oh1 v ih1 i oh1 v ih1 i oh1 v ih1 ? ? ? ? ? ? v ih1 i oh1 v ih1 i oh1 v ih1 i oh1 4.5v ? ? ? ? ? y1 y2 y3 y4 y5 y6 2.5 ? ? ? ? ? 2.5 ? ? ? ? ? 2.5 ? ? ? ? ? vdc ? ? ? ? ? v oh2 ? ? ? ? ? ? ? ? ? ? ? 21 22 23 24 25 26 5.0v ? ? ? ? ? i oh2 v ih1 i oh2 v ih1 i oh2 v ih1 ? ? ? ? ? ? v ih1 i oh2 v ih1 i oh2 v ih1 i oh2 5.0v ? ? ? ? ? y1 y2 y3 y4 y5 y6 4.5 ? ? ? ? ? 4.5 ? ? ? ? ? 4.5 ? ? ? ? ? ? ? ? ? ? ? v oh3 ? ? ? ? ? ? ? ? ? ? ? 27 28 29 30 31 32 ? ? ? ? ? ? v ih1 v ih1 v ih1 ? ? ? ? ? ? v ih1 v ih1 v ih1 ? ? ? ? ? ? y1 y2 y3 y4 y5 y6 4.95 ? ? ? ? ? 4.95 ? ? ? ? ? 4.95 ? ? ? ? ? ? ? ? ? ? ? v oh4 ? ? ? ? ? ? ? ? ? ? ? 33 34 35 36 37 38 12.5v ? ? ? ? ? v ih2 v ih2 v ih2 ? ? ? ? ? ? v ih2 v ih2 v ih2 12.5v ? ? ? ? ? y1 y2 y3 y4 y5 y6 11.25 ? ? ? ? ? 11.25 ? ? ? ? ? 11.25 ? ? ? ? ? ? ? ? ? ? ? v ol1 ? ? ? ? ? 3007 ? ? ? ? ? 39 40 41 42 43 44 5.5v ? ? ? ? ? i ol1 v il1 i ol1 v il1 i ol1 v il1 ? ? ? ? ? ? v il1 i ol1 v il1 i ol1 v il1 i ol1 5.5v ? ? ? ? ? y1 y2 y3 y4 y5 y6 0.5 ? ? ? ? ? 0.5 ? ? ? ? ? 0.5 ? ? ? ? ? ? ? ? ? ? ? see footnotes at end of device type 05. 18 mil-m-38510/55g
table iii. group a inspection for device types 02 and 04 ? continued. for terminal conditions and limits, see 1 / and 2 / test limits cases e,f,n, z 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 3 / subgroup 1 t c = 25 c subgroup 2 t c = 125 c subgroup 3 t c = -55 c symbol mil- std- 883 method test no. v cc y1 a1 y2 a2 y3 a3 v ss a4 y4 a5 y5 nc a6 y6 v dd measured terminal min max min max min max unit v ol2 ? ? ? ? ? 3007 ? ? ? ? ? 45 46 47 48 49 50 5.0v ? ? ? ? ? i ol2 v il1 i ol2 v il1 i ol2 v il1 gnd ? ? ? ? ? v il1 i ol2 v il1 i ol2 v il1 i ol2 5.0v ? ? ? ? ? y1 y2 y3 y4 y5 y6 0.5 ? ? ? ? ? 0.5 ? ? ? ? ? 0.5 ? ? ? ? ? vdc ? ? ? ? ? v ol3 ? ? ? ? ? ? ? ? ? ? ? 51 52 53 54 55 56 ? ? ? ? ? ? v il1 v il1 v il1 ? ? ? ? ? ? v il1 v il1 v il1 ? ? ? ? ? ? y1 y2 y3 y4 y5 y6 0.05 ? ? ? ? ? 0.05 ? ? ? ? ? 0.05 ? ? ? ? ? ? ? ? ? ? ? v ol4 ? ? ? ? ? ? ? ? ? ? ? 57 58 59 60 61 62 12.5v ? ? ? ? ? v il2 v il2 v il2 ? ? ? ? ? ? v il2 v il2 v il2 12.5v ? ? ? ? ? y1 y2 y3 y4 y5 y6 1.25 ? ? ? ? ? 1.25 ? ? ? ? ? 1.25 ? ? ? ? ? ? ? ? ? ? ? i ih1 6 / 3010 63 15.0v 15.0v 15.0v 15.0v ? 15.0v 15.0v 15.0v 15.0v all inputs together 600 na i ih2 ? ? ? ? ? ? ? ? ? ? ? 64 65 66 67 68 69 ? ? ? ? ? ? 15.0v gnd ? ? ? ? gnd 15.0v gnd ? ? ? gnd gnd 15.0v gnd ? ? ? ? ? ? ? ? gnd gnd gnd 15.0v gnd ? gnd ? ? ? 15.0v gnd gnd ? ? ? ? 15.0v ? ? ? ? ? ? a1 a2 a3 a4 a5 a6 100.0 ? ? ? ? ? 100.0 ? ? ? ? ? ? ? ? ? ? ? i il1 6 / 3009 70 ? ? ? ? ? ? ? gnd ? all inputs together -600 ? i il2 ? ? ? ? ? ? ? ? ? ? ? 71 72 73 74 75 76 ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? a1 a2 a3 a4 a5 a6 -100.0 ? ? ? ? ? -100.0 ? ? ? ? ? ? ? ? ? ? ? subgroup 4 t c = 25 c min max c i ? ? ? ? ? 3012 ? ? ? ? ? 77 78 79 80 81 82 gnd ? ? ? ? ? a 7 / a 7 / a 7 / gnd ? ? ? ? ? a 7 / a 7 / a 7 / gnd ? ? ? ? ? a1 a2 a3 a4 a5 a6 12 ? ? ? ? ? pf ? ? ? ? ? see footnotes at end of device type 05. 19 mil-m-38510/55g
table iii. group a inspection for device types 02 and 04 ? continued. for terminal conditions and limits, see 1 / and 2 / test limits cases e,f,n, z 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 3 / subgroup 9 t c = 25 c subgroup 10 t c = 125 c subgroup 11 t c = -55 c symbol mil- std- 883 method test no. v cc y1 a1 y2 a2 y3 a3 v ss a4 y4 a5 y5 nc a6 y6 v dd measure d terminal min max 8 / min max 8 / min max 8 / unit t phl ? ? ? ? ? 3003 fig. 3 ? ? ? ? 83 84 85 86 87 88 5.0v ? ? ? ? ? out in out in out in gnd ? ? ? ? ? in out in out in out 5.0v ? ? ? ? ? a1 to y1 a2 to y2 a3 to y3 a4 to y4 a5 to y5 a6 to y6 6 ? ? ? ? ? 100/ 150 ? ? ? ? 9 ? ? ? ? ? 150/ 225 ? ? ? ? 6 ? ? ? ? ? 100/ 150 ? ? ? ? ns ? ? ? ? ? t plh ? ? ? ? ? ? ? ? ? ? ? 89 90 91 92 93 94 ? ? ? ? ? ? out in out in out in ? ? ? ? ? ? in out in out in out ? ? ? ? ? ? a1 to y1 a2 to y2 a3 to y3 a4 to y4 a5 to y5 a6 to y6 6 ? ? ? ? ? 140/ 230 ? ? ? ? 9 ? ? ? ? ? 210/ 345 ? ? ? ? 6 ? ? ? ? ? 140/ 230 ? ? ? ? ? ? ? ? ? ? t thl ? ? ? ? ? 3004 fig. 3 ? ? ? ? 95 96 97 98 99 100 ? ? ? ? ? ? out in out in out in ? ? ? ? ? ? in out in out in out ? ? ? ? ? ? y1 y2 y3 y4 y5 y6 6 ? ? ? ? ? 60/70 ? ? ? ? ? 9 ? ? ? ? ? 90/ 105 ? ? ? ? 6 ? ? ? ? ? 60/70 ? ? ? ? ? ? ? ? ? ? ? t tlh ? ? ? ? ? ? ? ? ? ? ? 101 102 103 104 105 106 ? ? ? ? ? ? out in out in out in ? ? ? ? ? ? in out in out in out ? ? ? ? ? ? y1 y2 y3 y4 y5 y6 6 ? ? ? ? ? 270 ? ? ? ? ? 9 ? ? ? ? ? 405 ? ? ? ? ? 6 ? ? ? ? ? 270 ? ? ? ? ? ? ? ? ? ? ? see footnotes at end of device type 05. 20 mil-m-38510/55g
table iii. group a inspection for device type 05 . for terminal conditions and limits, see 1 / and 2 / test limits cases a,c,d x,y 1 2 3 4 5 6 7 8 9 10 11 12 13 14 subgroup 1 t c = 25 c subgroup 2 t c = 125 c subgroup 3 t c = -55 c symbol mil- std- 883 method test no. y1 y1 a1 y2 y2 a2 v ss y3 y3 a3 y4 y4 a4 v dd measured terminal min max min max min max unit v ic(pos) ? ? ? 1 2 3 4 1ma 1ma 1ma 1ma gnd ? ? ? a1 a2 a3 a4 1.5 ? ? ? vdc ? ? ? v ic(neg) ? ? ? 5 6 7 8 -1ma -1ma gnd ? ? ? -1ma -1ma a1 a2 a3 a4 -6 ? ? ? ? ? ? ? i ss i ss 3005 see 5 / 9 10 15.0v gnd 15.0v gnd ? ? 15.0v gnd 15.0v gnd 15.0v 15.0v v ss v ss -75 -75 -750 -750 na na v oh1 ? ? ? ? ? ? ? 3006 ? ? ? ? ? ? ? 11 12 13 14 15 16 17 18 i oh1 i oh1 v ih1 v il1 i oh1 i oh1 v ih1 v il1 ? ? ? ? ? ? ? ? i oh1 i oh1 v ih1 v il1 i oh1 i oh1 v ih1 v il1 4.5v ? ? ? ? ? ? ? y1 y2 y3 y4 y1 y2 y3 y4 2.5 ? ? ? ? ? ? ? 2.5 ? ? ? ? ? ? ? 2.5 ? ? ? ? ? ? ? vdc ? ? ? ? ? ? ? v oh2 ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 19 20 21 22 23 24 25 26 i oh2 i oh2 v ih1 v il1 i oh2 i oh2 v ih1 v il1 ? ? ? ? ? ? ? ? i oh2 i oh2 v ih1 v il1 i oh2 i oh2 v ih1 v il1 5.0v ? ? ? ? ? ? ? y1 y2 y3 y4 y1 y2 y3 y4 4.5 ? ? ? ? ? ? ? 4.5 ? ? ? ? ? ? ? 4.5 ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? v oh3 ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 27 28 29 30 31 32 33 34 v ih1 v il1 v ih1 v il1 ? ? ? ? ? ? ? ? v ih1 v il1 v ih1 v il1 ? ? ? ? ? ? ? ? y1 y2 y3 y4 y1 y2 y3 y4 4.95 ? ? ? ? ? ? ? 4.95 ? ? ? ? ? ? ? 4.95 ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? v oh4 ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 35 36 37 38 39 40 41 42 v ih2 v il2 v ih2 v il2 ? ? ? ? ? ? ? ? v ih2 v il2 v ih2 v il2 12.5v ? ? ? ? ? ? ? y1 y2 y3 y4 y1 y2 y3 y4 11.25 ? ? ? ? ? ? ? 11.25 ? ? ? ? ? ? ? 11.25 ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? see footnotes at end of device type 05. 21 mil-m-38510/55g
table iii. group a inspection for device type 05 ? continued. for terminal conditions and limits, see 1 / and 2 / test limits cases a,c,d x,y 1 2 3 4 5 6 7 8 9 10 11 12 13 14 subgroup 1 t c = 25 c subgroup 2 t c = 125 c subgroup 3 t c = -55 c symbol mil- std- 883 method test no. y1 y1 a1 y2 y2 a2 v ss y3 y3 a3 y4 y4 a4 v dd measured terminal min max min max min max unit v ol1 ? ? ? ? ? ? ? 3007 ? ? ? ? ? ? ? 43 44 45 46 47 48 49 50 i ol1 i ol1 v il1 v ih1 i ol1 i ol1 v il1 v ih1 gnd ? ? ? ? ? ? ? i ol1 i ol1 v il1 v ih1 i ol1 i ol1 v il1 v ih1 5.5v ? ? ? ? ? ? ? y1 y2 y3 y4 y1 y2 y3 y4 0.5 ? ? ? ? ? ? ? 0.5 ? ? ? ? ? ? ? 0.5 ? ? ? ? ? ? ? vdc ? ? ? ? ? ? ? v ol2 ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 51 52 53 54 55 56 57 58 i ol3 i ol4 v il1 v ih1 i ol3 i ol4 v il1 v ih1 ? ? ? ? ? ? ? ? i ol3 i ol4 v il1 v ih1 i ol3 i ol4 v il1 v ih1 5.0v ? ? ? ? ? ? ? y1 y2 y3 y4 y1 y2 y3 y4 0.5 ? ? ? ? ? ? ? 0.5 ? ? ? ? ? ? ? 0.5 ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? v ol3 ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 59 60 61 62 63 64 65 66 v il1 v ih1 v il1 v ih1 ? ? ? ? ? ? ? ? v il1 v ih1 v il1 v ih1 ? ? ? ? ? ? ? ? y1 y2 y3 y4 y1 y2 y3 y4 0.05 ? ? ? ? ? ? ? 0.05 ? ? ? ? ? ? ? 0.05 ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? v ol4 ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 67 68 69 70 71 72 73 74 v il2 v ih2 v il2 v ih2 ? ? ? ? ? ? ? ? v il2 v ih2 v il2 v ih2 12.5v ? ? ? ? ? ? ? y1 y2 y3 y4 y1 y2 y3 y4 1.25 ? ? ? ? ? ? ? 1.25 ? ? ? ? ? ? ? 1.25 ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? i ih1 6 / 3010 75 15.0v 15.0v ? 15.0v 15.0v 15.0v all inputs together 400 na i ih2 ? ? ? ? ? ? ? 76 77 78 79 15.0v gnd ? ? gnd 15.0v gnd gnd ? ? ? ? gnd gnd 15.0v gnd gnd gnd gnd 15.0v ? ? ? ? a1 a2 a3 a4 100 ? ? ? 100 ? ? ? ? ? ? ? i il1 5 / 3009 80 ? gnd ? gnd gnd ? all inputs together -400 ? see footnotes at end of device type 05. 22 mil-m-38510/55g
table iii. group a inspection for device type 05 ? continued. for terminal conditions and limits, see 1 / and 2 / test limits cases a,c,d x,y 1 2 3 4 5 6 7 8 9 10 11 12 13 14 subgroup 1 t c = 25 c subgroup 2 t c = 125 c subgroup 3 t c = -55 c symbol mil- std- 883 method test no. y1 y1 a1 y2 y2 a2 v ss y3 y3 a3 y4 y4 a4 v dd measured terminal min max min max min max unit i il2 ? ? ? 3009 ? ? ? 81 82 83 84 gnd ? ? ? gnd ? ? ? gnd ? ? ? gnd ? ? ? gnd ? ? ? 15.0v ? ? ? a1 a2 a3 a4 -100 ? ? ? -100 ? ? ? na ? ? ? subgroup 4 t c = 25 c min max c i ? ? ? 3012 ? ? ? 85 86 87 88 a 7 / a 7 / gnd ? ? ? a 7 / a 7 / gnd ? ? ? a1 a2 a3 a4 20 ? ? ? pf ? ? ? subgroup 9 t c = 25 c subgroup 10 t c = 125 c subgroup 11 t c = -55 c min max min max min max t phl ? ? ? ? ? ? ? 3003 fig. 3 ? ? ? ? ? ? 89 90 91 92 93 94 95 96 out out in in out out in in gnd ? ? ? ? ? ? ? out out in in out out in in 5.0v ? ? ? ? ? ? ? a1 to y1 a2 to y2 a3 to y3 a4 to y4 a1 to y1 a2 to y2 a3 to y3 a4 to y4 6 ? ? ? ? ? ? ? 115 ? ? ? ? ? ? ? 9 ? ? ? ? ? ? ? 172 ? ? ? ? ? ? ? 6 ? ? ? ? ? ? ? 172 ? ? ? ? ? ? ? ns ? ? ? ? ? ? ? t plh ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 97 98 99 100 101 102 103 104 out out in in out out in in ? ? ? ? ? ? ? ? out out in in out out in in ? ? ? ? ? ? ? ? a1 to y1 a2 to y2 a3 to y3 a4 to y4 a1 to y1 a2 to y2 a3 to y3 a4 to y4 6 ? ? ? ? ? ? ? 125 ? ? ? 110 ? ? ? 9 ? ? ? ? ? ? ? 188 ? ? ? 165 ? ? ? 6 ? ? ? ? ? ? ? 188 ? ? ? 165 ? ? ? ? ? ? ? ? ? ? ? t thl ? ? ? ? ? ? ? 3004 fig. 3 ? ? ? ? ? ? 105 106 107 108 109 110 111 112 out out in in out out in in ? ? ? ? ? ? ? ? out out in in out out in in ? ? ? ? ? ? ? ? y1 y2 y3 y4 y1 y2 y3 y4 6 ? ? ? ? ? ? ? 50 ? ? ? 110 ? ? ? 9 ? ? ? ? ? ? ? 75 ? ? ? 165 ? ? ? 6 ? ? ? ? ? ? ? 75 ? ? ? 165 ? ? ? ? ? ? ? ? ? ? ? t tlh ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 113 114 115 116 117 118 119 120 out out in in out out in in ? ? ? ? ? ? ? ? out out in in out out in in ? ? ? ? ? ? ? ? y1 y2 y3 y4 y1 y2 y3 y4 6 ? ? ? ? ? ? ? 70 ? ? ? 120 ? ? ? 9 ? ? ? ? ? ? ? 105 ? ? ? 180 ? ? ? 6 ? ? ? ? ? ? ? 105 ? ? ? 180 ? ? ? ? ? ? ? ? ? ? ? see footnotes on next sheet. 23 mil-m-38510/55g
1 / input pins not designated may be tied to v dd (or v cc ) or gnd or may be left open provided they do no t influence the outcome of the measurement. output pins not designated may be tied to the loads or may be left open provided they do not in fluence the outcome of the meas urement. 2 / symbol v ih1 v il1 v ih2 v il2 i oh1 i ol1 i oh2 i ol2 i ol3 i ol4 device type 01 03 05 02 04 01 03 05 02 04 01 03 05 02 04 01 03 05 02 04 all all all all 05 05 temperature t c = 25 c 3.95 v 3.8 v 0.9 v 1.1 v 10.25 v 9. 5 v 2.15 v 2.8 v -.1 ma .23 ma -.45 ma 3.0 ma 1.6 ma 0.8 ma t c = 125 c 3.85 v 3.6 v 0.65 v 0.85 v 10.0 v 9. 25 v 1.95 v 2.55 v -.1 ma .23 ma -.35 ma 2.1 ma 1.2 ma 0.55 ma t c = -55 c 4.05 v 3.95 v 0.95 v 1.35 v 10.5 v 9. 75 v 2.24 v 3.05 v -.1 ma .23 ma -.65 ma 3.7 ma 2.1 ma 1.0 ma 3 / terminal 16 is not connected for device types 03 and 04. 4 / test parameter v ic(pos) does not apply to device types 03 and 04. 5 / when performing quiescent supply current measurements (i ss ), the meter shall be placed so that all currents flow through the meter. 6 / the device manufacturer may, at his option, measure i il and i ih at 25 c for each individual input or measure all inputs together. 7 / (a) capacitance bridge between measured terminal and v ss ; frequency = 1 mhz. 8 / test limits t phl , t plh , t thl , and t tlh for device types 01/03 and 02/04 consists of two sets of values and are expressed xxx/xxxx in the limits columns. the digits preceding the slash apply to the first device in a set. 24 mil-m-38510/55g
table iii. group a inspection for device types 51 and 53 . for terminal conditions and limits, see 1 / test limits cases e,f,n, z 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 2 / subgroup 1 t c = 25 c subgroup 2 t c = 125 c subgroup 3 t c = -55 c symbol mil- std- 883 method test no. v cc y1 a1 y2 a2 y3 a3 v ss a4 y4 a5 y5 nc a6 y6 v dd measured terminal min max min max min max unit v ic(pos) ? ? ? ? ? 3 / 1 2 3 4 5 6 gnd ? ? ? ? ? 1ma 1ma 1ma 1ma 1ma 1ma gnd ? ? ? ? ? a1 a2 a3 a4 a5 a6 1.5 ? ? ? ? ? vdc ? ? ? ? ? v ic(neg) ? ? ? ? ? 7 8 9 10 11 12 -1ma -1ma -1ma gnd ? ? ? ? ? -1ma -1ma -1ma a1 a2 a3 a4 a5 a6 -6.0 ? ? ? ? ? ? ? ? ? ? ? i ss i ss 3005 4 / 3005 4 / 13 14 18 v 18 v 18 v gnd 18 v gnd 18 v gnd ? ? 18 v gnd 18 v gnd 18 v gnd 18 v 18 v v ss v ss -75 -75 -750 -750 nadc nadc v oh5 ? ? ? ? ? 3006 ? ? ? ? ? 15 16 17 18 19 20 15 v ? ? ? ? ? gnd gnd gnd ? ? ? ? ? ? gnd gnd gnd 15 v ? ? ? ? ? y1 y2 y3 y4 y5 y6 14.95 ? ? ? ? ? 14.95 ? ? ? ? ? 14.95 ? ? ? ? ? vdc ? ? ? ? ? v ol5 ? ? ? ? ? 3007 ? ? ? ? ? 21 22 23 24 25 26 15 v ? ? ? ? ? 15 v 15 v 15 v ? ? ? ? ? ? 15 v 15 v 15 v ? ? ? ? ? ? y1 y2 y3 y4 y5 y6 0.05 ? ? ? ? ? 0.05 ? ? ? ? ? 0.05 ? ? ? ? ? ? ? ? ? ? ? v ih1 ? ? ? ? ? 27 28 29 30 31 32 5 v ? ? ? ? ? 4.0 v gnd ? ? ? ? gnd 4.0 v gnd ? ? ? gnd gnd 4.0 v gnd ? ? ? ? ? ? ? ? gnd gnd gnd 4.0 v gnd ? gnd ? ? ? 4.0 v gnd gnd ? ? ? ? 4.0 v 5 v ? ? ? ? ? y1 y2 y3 y4 y5 y6 0.5 ? ? ? ? ? 0.5 ? ? ? ? ? 0.5 ? ? ? ? ? ? ? ? ? ? ? v ih2 ? ? ? ? ? 33 34 35 36 37 38 10 v ? ? ? ? ? 8.0 v gnd ? ? ? ? ? 8.0 v gnd ? ? ? ? ? 8.0 v gnd ? ? ? ? ? ? ? ? ? ? ? 8.0 v gnd ? ? ? ? ? 8.0 v gnd gnd ? ? ? ? 8.0 v 10 v ? ? ? ? ? y1 y2 y3 y4 y5 y6 1.0 ? ? ? ? ? 1.0 ? ? ? ? ? 1.0 ? ? ? ? ? ? ? ? ? ? ? v ih3 ? ? ? ? ? 39 40 41 42 43 44 15 v ? ? ? ? ? 12.5 v gnd ? ? ? ? ? 12.5 v gnd ? ? ? ? ? 12.5 v gnd gnd gnd ? ? ? ? ? ? ? ? ? 12.5 v gnd gnd ? ? ? ? 12.5 v gnd gnd ? ? ? ? 12.5 v 15 v ? ? ? ? ? y1 y2 y3 y4 y5 y6 1.5 ? ? ? ? ? 1.5 ? ? ? ? ? 1.5 ? ? ? ? ? ? ? ? ? ? ? see footnotes at end of device type 55. 25 mil-m-38510/55g
table iii. group a inspection for device types 51 and 53 ? continued. for terminal conditions and limits, see 1 / test limits cases e,f,n, z 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 2 / subgroup 1 t c = 25 c subgroup 2 t c = 125 c subgroup 3 t c = -55 c symbol mil- std- 883 method test no. v cc y1 a1 y2 a2 y3 a3 v ss a4 y4 a5 y5 nc a6 y6 v dd measured terminal min max min max min max unit v il1 45 46 47 48 49 50 5 v ? ? ? ? ? 1.0 v gnd ? ? ? ? gnd 1.0 v gnd ? ? ? gnd gnd 1.0 v gnd ? ? gnd ? ? ? ? ? gnd ? ? 1.0 v gnd ? gnd ? ? ? 1.0 v gnd gnd ? ? ? ? 1.0 v 5 v ? ? ? ? ? y1 y2 y3 y4 y5 y6 4.5 ? ? ? ? ? 4.5 ? ? ? ? ? 4.5 ? ? ? ? ? vdc ? ? ? ? ? v il2 51 52 53 54 55 56 10 v ? ? ? ? ? 2.0 v gnd ? ? ? ? ? 2.0 v gnd ? ? ? ? ? 2.0 v gnd ? ? ? ? ? ? ? ? ? ? ? 2.0 v gnd ? ? ? ? ? 2.0 v gnd gnd ? ? ? ? 2.0 v 10 v ? ? ? ? ? y1 y2 y3 y4 y5 y6 9.0 ? ? ? ? ? 9.0 ? ? ? ? ? 9.0 ? ? ? ? ? ? ? ? ? ? ? v il3 57 58 59 60 61 62 15 v ? ? ? ? ? 2.5 v gnd ? ? ? ? ? 2.5 v gnd ? ? ? ? ? 2.5 v gnd ? ? ? ? ? ? ? ? ? ? ? 2.5 v gnd ? ? ? ? ? 2.5 v gnd gnd ? ? ? ? 2.5 v 15 v ? ? ? ? ? y1 y2 y3 y4 y5 y6 13.5 ? ? ? ? ? 13.5 ? ? ? ? ? 13.5 ? ? ? ? ? ? ? ? ? ? ? i ol1 63 64 65 66 67 68 5 v ? ? ? ? ? 0.4 v 5 v gnd ? ? ? ? 0.4 v ? 5 v gnd ? ? ? 0.4 v ? ? 5 v gnd ? ? ? ? ? ? ? ? ? ? ? 5 v gnd ? 0.4 v ? ? ? ? 5 v gnd 0.4 v gnd ? ? ? ? 5 v 0.4 v 5 v ? ? ? ? ? y1 y2 y3 y4 y5 y6 3.2 ? ? ? ? ? 2.2 ? ? ? ? ? 4.0 ? ? ? ? ? ma ? ? ? ? ? i ol2 69 70 71 72 73 74 15 v ? ? ? ? ? 1.5 v 15 v gnd ? ? ? ? 1.5 v ? 15 v gnd ? ? ? 1.5 v ? ? 15 v gnd ? ? ? ? ? ? ? ? ? ? ? 15 v gnd ? 1.5 v ? ? ? ? 15 v gnd 1.5 v gnd ? ? ? ? 15 v 1.5 v 15 v ? ? ? ? ? y1 y2 y3 y4 y5 y6 24.0 ? ? ? ? ? 17.0 ? ? ? ? ? 30.0 ? ? ? ? ? ? ? ? ? ? ? i oh1 75 76 77 78 79 80 5 v ? ? ? ? ? 4.6 v ? ? ? ? ? ? 4.6 v ? ? ? ? ? ? 4.6 v ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 4.6 v ? ? ? ? ? ? 4.6 v gnd ? ? ? ? ? 4.6 v 5 v ? ? ? ? ? y1 y2 y3 y4 y5 y6 -0.51 ? ? ? ? ? -0.36 ? ? ? ? ? -0.64 ? ? ? ? ? ? ? ? ? ? ? i oh2 81 82 83 84 85 86 15 v ? ? ? ? ? 13.5 v ? ? ? ? ? ? 13.5 v ? ? ? ? ? ? 13.5 v ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 13.5 v ? ? ? ? ? ? 13.5 v ? ? ? ? ? ? 13.5 v 15 v ? ? ? ? ? y1 y2 y3 y4 y5 y6 -3.4 ? ? ? ? ? -2.4 ? ? ? ? ? -4.2 ? ? ? ? ? ? ? ? ? ? ? i ih1 5 / 3010 87 18 v 18 v 18 v 18 v ? 18 v 18 v 18 v 18 v all inputs together 600 na see footnotes at end of device type 55. 26 mil-m-38510/55g
table iii. group a inspection for device types 51 and 53 ? continued. for terminal conditions and limits, see 1 / test limits cases e,f,n, z 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 2 / subgroup 1 t c = 25 c subgroup 2 t c = 125 c subgroup 3 t c = -55 c symbol mil- std- 883 method test no. v cc y1 a1 y2 a2 y3 a3 v ss a4 y4 a5 y5 nc a6 y6 v dd measured terminal min max min max min max unit i ih2 ? ? ? ? ? 3010 ? ? ? ? ? 88 89 90 91 92 93 18 v ? ? ? ? ? 18 v gnd ? ? ? ? gnd 18 v gnd ? ? ? gnd gnd 18 v gnd ? ? gnd ? ? ? ? ? gnd ? ? 18 v gnd gnd gnd ? ? ? 18 v gnd gnd ? ? ? ? 18 v 18 v ? ? ? ? ? a1 a2 a3 a4 a5 a6 100.0 ? ? ? ? ? 100.0 ? ? ? ? ? na ? ? ? ? ? i il1 5 / 3009 94 ? ? ? ? ? gnd gnd gnd ? all inputs together -600 ? i il2 ? ? ? ? ? ? ? ? ? ? ? 95 96 97 98 99 100 ? ? ? ? ? ? ? 18 v ? ? ? ? 18 v gnd 18 v ? ? ? 18 v 18 v gnd 18 v ? ? ? ? ? ? ? ? 18 v 18 v 18 v gnd 18 v 18 v 18 v ? ? ? gnd 18 v 18 v ? ? ? ? gnd ? ? ? ? ? ? a1 a2 a3 a4 a5 a6 -100.0 ? ? ? ? ? -100.0 ? ? ? ? ? ? ? ? ? ? ? subgroup 4 t c = 25 c min max c i ? ? ? ? ? 3012 ? ? ? ? ? 101 102 103 104 105 106 gnd ? ? ? ? ? a 6 / a 6 / a 6 / gnd ? ? ? ? ? a 6 / a 6 / a 6 / gnd ? ? ? ? ? a1 a2 a3 a4 a5 a6 20 ? ? ? ? ? pf ? ? ? ? ? see footnotes at end of device type 55. 27 mil-m-38510/55g
table iii. group a inspection for device types 51 and 53 ? continued. for terminal conditions and limits, see 1 / test limits cases e,f,n, z 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 2 / subgroup 9 t c = 25 c subgroup 10 t c = 125 c subgroup 11 t c = -55 c symbol mil- std-883 method test no. v cc y1 a1 y2 a2 y3 a3 v ss a4 y4 a5 y5 nc a6 y6 v dd measured terminal min max 7 / min max 7 / min max 7 / unit t phl ? ? ? ? ? 3003 fig. 3 ? ? ? ? 107 108 109 110 111 112 5.0 v ? ? ? ? ? out in out in out in gnd ? ? ? ? ? in out in out in out 5.0 v ? ? ? ? ? a1 to y1 a2 to y2 a3 to y3 a4 to y4 a5 to y5 a6 to y6 6 ? ? ? ? ? 60/65 ? ? ? ? ? 9 ? ? ? ? ? 150/ 225 ? ? ? ? 6 ? ? ? ? ? 60/65 ? ? ? ? ? ns ? ? ? ? ? t plh ? ? ? ? ? ? ? ? ? ? ? 113 114 115 116 117 118 ? ? ? ? ? ? out in out in out in ? ? ? ? ? ? in out in out in out ? ? ? ? ? ? a1 to y1 a2 to y2 a3 to y3 a4 to y4 a5 to y5 a6 to y6 6 ? ? ? ? ? 140/ 120 ? ? ? ? 9 ? ? ? ? ? 210/ 345 ? ? ? ? 6 ? ? ? ? ? 140/ 120 ? ? ? ? ? ? ? ? ? ? t thl ? ? ? ? ? 3004 fig. 3 ? ? ? ? 119 120 121 122 123 124 ? ? ? ? ? ? out in out in out in ? ? ? ? ? ? in out in out in out ? ? ? ? ? ? y1 y2 y3 y4 y5 y6 6 ? ? ? ? ? 70/60 ? ? ? ? ? 9 ? ? ? ? ? 90/ 105 ? ? ? ? 6 ? ? ? ? ? 70/ 60 ? ? ? ? ? ? ? ? ? ? t tlh ? ? ? ? ? ? ? ? ? ? ? 125 126 127 128 129 130 ? ? ? ? ? ? out in out in out in ? ? ? ? ? ? in out in out in out ? ? ? ? ? ? y1 y2 y3 y4 y5 y6 6 ? ? ? ? ? 350/ 160 ? ? ? ? 9 ? ? ? ? ? 405 ? ? ? ? ? 6 ? ? ? ? ? 350/ 160 ? ? ? ? ? ? ? ? ? ? see footnotes at end of device type 55. 28 mil-m-38510/55g
table iii. group a inspection for device types 52 and 54 . for terminal conditions and limits, see 1 / test limits cases e,f,n, z 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 2 / subgroup 1 t c = 25 c subgroup 2 t c = 125 c subgroup 3 t c = -55 c symbol mil- std- 883 method test no. v cc y1 a1 y2 a2 y3 a3 v ss a4 y4 a5 y5 nc a6 y6 v dd measured terminal min max min max min max unit v ic(pos) ? ? ? ? ? 3/ 1 2 3 4 5 6 gnd ? ? ? ? ? 1ma 1ma 1ma 1ma 1ma 1ma gnd ? ? ? ? ? a1 a2 a3 a4 a5 a6 1.5 ? ? ? ? ? vdc ? ? ? ? ? v ic(neg) ? ? ? ? ? 7 8 9 10 11 12 -1ma -1ma -1ma gnd ? ? ? ? ? -1ma -1ma -1ma a1 a2 a3 a4 a5 a6 -6.0 ? ? ? ? ? ? ? ? ? ? ? i ss i ss 3005 4 / 3005 4 / 13 14 18 v 18 v 18 v gnd 18 v gnd 18 v gnd ? ? 18 v gnd 18 v gnd 18 v gnd 18 v 18 v v ss v ss -75 -75 -750 -750 nadc nadc v oh5 ? ? ? ? ? 3006 ? ? ? ? ? 15 16 17 18 19 20 15 v ? ? ? ? ? 15 v 15 v 15 v ? ? ? ? ? ? 15 v 15 v 15 v 15 v ? ? ? ? ? y1 y2 y3 y4 y5 y6 14.95 ? ? ? ? ? 14.95 ? ? ? ? ? 14.95 ? ? ? ? ? vdc ? ? ? ? ? v ol5 ? ? ? ? ? 3007 ? ? ? ? ? 21 22 23 24 25 26 15 v ? ? ? ? ? gnd gnd gnd ? ? ? ? ? ? gnd gnd gnd ? ? ? ? ? ? y1 y2 y3 y4 y5 y6 0.05 ? ? ? ? ? 0.05 ? ? ? ? ? 0.05 ? ? ? ? ? ? ? ? ? ? ? v ih1 ? ? ? ? ? 27 28 29 30 31 32 5 v ? ? ? ? ? 3.5 v gnd ? ? ? ? gnd 3.5 v gnd ? ? ? gnd gnd 3.5 v gnd ? ? ? ? ? ? ? ? gnd gnd gnd 3.5 v gnd ? gnd ? ? ? 3.5 v gnd gnd ? ? ? ? 3.5 v 5 v ? ? ? ? ? y1 y2 y3 y4 y5 y6 4.5 ? ? ? ? ? 4.5 ? ? ? ? ? 4.5 ? ? ? ? ? ? ? ? ? ? ? v ih2 ? ? ? ? ? 33 34 35 36 37 38 10 v ? ? ? ? ? 7 v gnd ? ? ? ? ? 7 v gnd ? ? ? ? ? 7 v gnd ? ? ? ? ? ? ? ? ? ? ? 7 v gnd ? ? ? ? ? 7 v gnd gnd ? ? ? ? 7 v 10 v ? ? ? ? ? y1 y2 y3 y4 y5 y6 9.0 ? ? ? ? ? 9.0 ? ? ? ? ? 9.0 ? ? ? ? ? ? ? ? ? ? ? v ih3 ? ? ? ? ? 39 40 41 42 43 44 15 v ? ? ? ? ? 11 v gnd ? ? ? ? gnd 11 v gnd ? ? ? ? ? 11 v gnd gnd gnd ? ? ? ? ? ? ? ? ? 11 v gnd gnd ? ? ? ? 11 v gnd gnd ? ? ? ? 11 v 15 v ? ? ? ? ? y1 y2 y3 y4 y5 y6 13.5 ? ? ? ? ? 13.5 ? ? ? ? ? 13.5 ? ? ? ? ? ? ? ? ? ? ? see footnotes at the end of device type 55. 29 mil-m-38510/55g
table iii. group a inspection for device types 52 and 54 ? continued. for terminal conditions and limits, see 1 / test limits cases e,f,n, z 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 2 / subgroup 1 t c = 25 c subgroup 2 t c = 125 c subgroup 3 t c = -55 c symbol mil- std- 883 method test no. v cc y1 a1 y2 a2 y3 a3 v ss a4 y4 a5 y5 nc a6 y6 v dd measured terminal min max min max min max unit v il1 ? ? ? ? ? 45 46 47 48 49 50 5.0 v ? ? ? ? ? 1.5 v gnd ? ? ? ? gnd 1.5 v gnd ? ? ? gnd gnd 1.5 v gnd ? ? gnd ? ? ? ? ? gnd gnd gnd 1.5 v gnd ? gnd ? ? ? 1.5 v gnd gnd ? ? ? ? 1.5 v 5 v ? ? ? ? ? y1 y2 y3 y4 y5 y6 0.5 ? ? ? ? ? 0.5 ? ? ? ? ? 0.5 ? ? ? ? ? vdc ? ? ? ? ? v il2 ? ? ? ? ? 51 52 53 54 55 56 10 v ? ? ? ? ? 3 v gnd ? ? ? ? ? 3 v gnd ? ? ? ? ? 3 v gnd ? ? ? ? ? ? ? ? ? ? ? 3 v gnd ? ? ? ? ? 3 v gnd gnd ? ? ? ? 3 v 10 v ? ? ? ? ? y1 y2 y3 y4 y5 y6 1.0 ? ? ? ? ? 1.0 ? ? ? ? ? 1.0 ? ? ? ? ? ? ? ? ? ? ? v il3 ? ? ? ? ? 57 58 59 60 61 62 15 v ? ? ? ? ? 4 v gnd ? ? ? ? ? 4 v gnd ? ? ? ? ? 4 v gnd ? ? ? ? ? ? ? ? ? ? ? 4 v gnd ? ? ? ? ? 4 v gnd gnd ? ? ? ? 4 v 15 v ? ? ? ? ? y1 y2 y3 y4 y5 y6 1.5 ? ? ? ? ? 1.5 ? ? ? ? ? 1.5 ? ? ? ? ? ? ? ? ? ? ? i ol1 ? ? ? ? ? 63 64 65 66 67 68 5 v ? ? ? ? ? 0.4 v ? ? ? ? ? ? 0.4 v ? ? ? ? ? ? 0.4 v ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 0.4 v ? ? ? ? ? ? 0.4 v gnd ? ? ? ? ? 0.4 v 5 v ? ? ? ? ? y1 y2 y3 y4 y5 y6 3.2 ? ? ? ? ? 2.2 ? ? ? ? ? 4.0 ? ? ? ? ? ma ? ? ? ? ? i ol2 ? ? ? ? ? 69 70 71 72 73 74 15 v ? ? ? ? ? 1.5 v ? ? ? ? ? ? 1.5 v ? ? ? ? ? ? 1.5 v ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 1.5 v ? ? ? ? ? ? 1.5 v ? ? ? ? ? ? 1.5 v 15 v ? ? ? ? ? y1 y2 y3 y4 y5 y6 24.0 ? ? ? ? ? 17.0 ? ? ? ? ? 30.0 ? ? ? ? ? ? ? ? ? ? ? i oh1 ? ? ? ? ? 75 76 77 78 79 80 5.0 v ? ? ? ? ? 4.6 v 5.0 v gnd ? ? ? ? 4.6 v ? 5.0 v gnd ? ? ? 4.6 v ? ? 5.0 v gnd ? ? ? ? ? ? ? ? ? ? ? 5.0 v gnd ? 4.6 v ? ? ? ? 5 v gnd 4.6 v ? ? ? ? ? 5 v 4.6 v 5.0 v ? ? ? ? ? y1 y2 y3 y4 y5 y6 -0.51 ? ? ? ? ? -0.36 ? ? ? ? ? -0.64 ? ? ? ? ? ? ? ? ? ? ? i oh2 ? ? ? ? ? 81 82 83 84 85 86 15 v ? ? ? ? ? 13.5 v 15 v gnd ? ? ? ? 13.5 v ? 15 v gnd ? ? ? 13.5 v ? ? 15 v gnd gnd gnd ? ? ? ? ? ? ? ? ? 15 v gnd gnd 13.5 v ? ? ? ? 15 v gnd 13.5 v gnd ? ? ? ? 15 v 13.5 v 15 v ? ? ? ? ? y1 y2 y3 y4 y5 y6 -3.4 ? ? ? ? ? -2.4 ? ? ? ? ? -4.2 ? ? ? ? ? ? ? ? ? ? ? i ih1 5 / 3010 87 18 v 18 v 18 v 18 v ? 18 v 18 v 18 v 18 v all inputs together 600 na see footnotes at end of device type 55. 30 mil-m-38510/55g
table iii. group a inspection for device types 52 and 54 ? continued. for terminal conditions and limits, see 1 / test limits cases e,f,n, z 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 2 / subgroup 1 t c = 25 c subgroup 2 t c = 125 c subgroup 3 t c = -55 c symbol mil- std- 883 method test no. v cc y1 a1 y2 a2 y3 a3 v ss a4 y4 a5 y5 nc a6 y6 v dd measured terminal min max min max min max unit i ih2 ? ? ? ? ? 3010 ? ? ? ? ? 88 89 90 91 92 93 18 v ? ? ? ? ? 18 v gnd ? ? ? ? gnd 18 v gnd ? ? ? gnd gnd 18 v gnd ? ? gnd ? ? ? ? ? gnd gnd gnd 18 v gnd gnd gnd ? ? ? 18 v gnd gnd ? ? ? ? 18 v 18 v ? ? ? ? ? a1 a2 a3 a4 a5 a6 100.0 ? ? ? ? ? 100.0 ? ? ? ? ? na ? ? ? ? ? i il1 5 / 3009 94 ? ? ? ? ? gnd gnd gnd ? all inputs together -600 ? i il2 ? ? ? ? ? ? ? ? ? ? ? 95 96 97 98 99 100 ? ? ? ? ? ? ? 18 v ? ? ? ? 18 v gnd 18 v ? ? ? 18 v 18 v gnd 18 v ? ? ? ? ? ? ? ? 18 v 18 v 18 v gnd 18 v 18 v 18 v ? ? ? gnd 18 v 18 v ? ? ? ? gnd ? ? ? ? ? ? a1 a2 a3 a4 a5 a6 -100.0 ? ? ? ? ? -100.0 ? ? ? ? ? ? ? ? ? ? ? subgroup 4 t c = 25 c min max c i ? ? ? ? ? 3012 ? ? ? ? ? 101 102 103 104 105 106 gnd ? ? ? ? ? a 6 / a 6 / a 6 / gnd ? ? ? ? ? a 6 / a 6 / a 6 / gnd ? ? ? ? ? a1 a2 a3 a4 a5 a6 12 ? ? ? ? ? pf ? ? ? ? ? see footnotes at end of device type 55. 31 mil-m-38510/55g
table iii. group a inspection for device types 52 and 54 ? continued. for terminal conditions and limits, see 1 / test limits cases e,f,n, z 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 2 / subgroup 9 t c = 25 c subgroup 10 t c = 125 c subgroup 11 t c = -55 c symbol mil- std- 883 method test no. v cc y1 a1 y2 a2 y3 a3 v ss a4 y4 a5 y5 nc a6 y6 v dd measured terminal min max 7 / min max 7 / min max 7 / unit t phl ? ? ? ? ? 3003 fig. 3 ? ? ? ? 107 108 109 110 111 112 5.0 v ? ? ? ? ? out in out in out in gnd ? ? ? ? ? in out in out in out 5.0 v ? ? ? ? ? a1 to y1 a2 to y2 a3 to y3 a4 to y4 a5 to y5 a6 to y6 6 ? ? ? ? ? 60/65 ? ? ? ? ? 9 ? ? ? ? ? 150/ 225 ? ? ? ? 6 ? ? ? ? ? 60/65 ? ? ? ? ? ns ? ? ? ? ? t plh ? ? ? ? ? ? ? ? ? ? ? 113 114 115 116 117 118 ? ? ? ? ? ? out in out in out in ? ? ? ? ? ? in out in out in out ? ? ? ? ? ? a1 to y1 a2 to y2 a3 to y3 a4 to y4 a5 to y5 a6 to y6 6 ? ? ? ? ? 140/ 120 ? ? ? ? 9 ? ? ? ? ? 210/ 345 ? ? ? ? 6 ? ? ? ? ? 140/ 120 ? ? ? ? ? ? ? ? ? ? t thl ? ? ? ? ? 3004 fig. 3 ? ? ? ? 119 120 121 122 123 124 ? ? ? ? ? ? out in out in out in ? ? ? ? ? ? in out in out in out ? ? ? ? ? ? y1 y2 y3 y4 y5 y6 6 ? ? ? ? ? 70/60 ? ? ? ? ? 9 ? ? ? ? ? 90/ 105 ? ? ? ? 6 ? ? ? ? ? 70/60 ? ? ? ? ? ? ? ? ? ? ? t tlh ? ? ? ? ? ? ? ? ? ? ? 125 126 127 128 129 130 ? ? ? ? ? ? out in out in out in ? ? ? ? ? ? in out in out in out ? ? ? ? ? ? y1 y2 y3 y4 y5 y6 6 ? ? ? ? ? 350/ 160 ? ? ? ? 9 ? ? ? ? ? 405 ? ? ? ? ? 6 ? ? ? ? ? 350/ 160 ? ? ? ? ? ? ? ? ? ? see footnotes at end of device type 55. 32 mil-m-38510/55g
table iii. group a inspection for device type 55 . for terminal conditions and limits, see 1 / test limits cases a,c,d, t,x,y 1 2 3 4 5 6 7 8 9 10 11 12 13 14 subgroup 1 t c = 25 c subgroup 2 t c = 125 c subgroup 3 t c = -55 c symbol mil- std- 883 method test no. y1 y1 a1 y2 y2 a2 v ss y3 y3 a3 y4 y4 a4 v dd measured terminal min max min max min max unit v ic(pos) ? ? ? 1 2 3 4 1ma 1ma 1ma 1ma gnd ? ? ? a1 a2 a3 a4 1.5 ? ? ? vdc ? ? ? v ic(neg) ? ? ? 5 6 7 8 -1ma -1ma gnd ? ? ? -1ma -1ma a1 a2 a3 a4 -6.0 ? ? ? ? ? ? ? i ss i ss 3005 4 / 3005 4 / 9 10 15 v gnd 15 v gnd ? ? 15 v gnd 15 v gnd 15 v ? v ss v ss -75 -75 -750 -750 na na v oh5 ? ? ? ? ? ? ? 3006 ? ? ? ? ? ? ? 11 12 13 14 15 16 17 18 15 v gnd 15 v gnd ? ? ? ? ? ? ? ? 15 v gnd 15 v gnd ? ? ? ? ? ? ? ? y1 y2 y3 y4 y1 y2 y3 y4 14.95 ? ? ? ? ? ? ? 14.95 ? ? ? ? ? ? ? 14.95 ? ? ? ? ? ? ? vdc ? ? ? ? ? ? ? v ol5 ? ? ? ? ? ? ? 3007 ? ? ? ? ? ? ? 19 20 21 22 23 24 25 26 gnd 15 v gnd 15 v ? ? ? ? ? ? ? ? gnd 15 v gnd 15 v ? ? ? ? ? ? ? ? y1 y2 y3 y4 y1 y2 y3 y4 0.05 ? ? ? ? ? ? ? 0.05 ? ? ? ? ? ? ? 0.05 ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? v ih1 ? ? ? ? ? ? ? 27 28 29 30 31 32 33 34 3.5 v gnd gnd gnd 3.5 v gnd gnd gnd gnd 3.5 v gnd gnd gnd 3.5 v gnd gnd ? ? ? ? ? ? ? ? gnd gnd 3.5 v gnd gnd gnd 3.5 v gnd gnd gnd gnd 3.5 v gnd gnd gnd 3.5 v 5 v ? ? ? ? ? ? ? y1 y2 y3 y4 y1 y2 y3 y4 4.5 ? ? ? 0.5 ? ? ? 4.5 ? ? ? 0.5 ? ? ? 4.5 ? ? ? 0.5 ? ? ? ? ? ? ? ? ? ? ? v ih2 ? ? ? ? ? ? ? 35 36 37 38 39 40 41 42 7 v gnd gnd gnd 7 v gnd gnd gnd gnd 7 v gnd gnd gnd 7 v gnd gnd ? ? ? ? ? ? ? ? gnd gnd 7 v gnd gnd gnd 7 v gnd gnd gnd gnd 7 v gnd gnd gnd 7 v 10 v ? ? ? ? ? ? ? y1 y2 y3 y4 y1 y2 y3 y4 9.0 ? ? ? 1.0 ? ? ? 9.0 ? ? ? 1.0 ? ? ? 9.0 ? ? ? 1.0 ? ? ? ? ? ? ? ? ? ? ? see footnotes at end of device type 55. 33 mil-m-38510/55g
table iii. group a inspection for device type 55 ? continued. for terminal conditions and limits, see 1 / test limits cases a,c,d, t,x,y 1 2 3 4 5 6 7 8 9 10 11 12 13 14 subgroup 1 t c = 25 c subgroup 2 t c = 125 c subgroup 3 t c = -55 c symbol mil- std- 883 method test no. y1 y1 a1 y2 y2 a2 v ss y3 y3 a3 y4 y4 a4 v dd measured terminal min max min max min max unit v ih3 ? ? ? ? ? ? ? 43 44 45 46 47 48 49 50 11 v gnd gnd gnd 11 v gnd gnd gnd gnd 11 v gnd gnd gnd 11 v gnd gnd gnd ? ? ? ? ? ? ? gnd gnd 11 v gnd gnd gnd 11 v gnd gnd gnd gnd 11 v gnd gnd gnd 11 v 15 v ? ? ? ? ? ? ? y1 y2 y3 y4 y1 y2 y3 y4 13.5 ? ? ? 1.5 ? ? ? 13.5 ? ? ? 1.5 ? ? ? 13.5 ? ? ? 1.5 ? ? ? vdc ? ? ? ? ? ? ? v il1 ? ? ? ? ? ? ? 51 52 53 54 55 56 57 58 1.5 v gnd gnd gnd 1.5 v gnd gnd gnd gnd 1.5 v gnd gnd gnd 1.5 v gnd gnd ? ? ? ? ? ? ? ? gnd gnd 1.5 v gnd gnd gnd 1.5 v gnd gnd gnd gnd 1.5 v gnd gnd gnd 1.5 v 5 v ? ? ? ? ? ? ? y1 y2 y3 y4 y1 y2 y3 y4 4.5 ? ? ? 0.5 ? ? ? 4.5 ? ? ? 0.5 ? ? ? 4.5 ? ? ? 0.5 ? ? ? ? ? ? ? ? ? ? ? v il2 ? ? ? ? ? ? ? 59 60 61 62 63 64 65 66 3 v gnd gnd gnd 3 v gnd gnd gnd gnd 3 v gnd gnd gnd 3 v gnd gnd ? ? ? ? ? ? ? ? gnd gnd 3 v gnd gnd gnd 3 v gnd gnd gnd gnd 3 v gnd gnd gnd 3 v 10 v ? ? ? ? ? ? ? y1 y2 y3 y4 y1 y2 y3 y4 9.0 ? ? ? 1.0 ? ? ? 9.0 ? ? ? 1.0 ? ? ? 9.0 ? ? ? 1.0 ? ? ? ? ? ? ? ? ? ? ? v il3 ? ? ? ? ? ? ? 67 68 69 70 71 72 73 74 4 v gnd gnd gnd 4 v gnd ? ? gnd 4 v gnd gnd gnd 4 v gnd ? ? ? ? ? ? ? ? ? gnd gnd 4 v gnd gnd gnd 4 v gnd gnd gnd gnd 4 v gnd gnd gnd 4 v 15 v ? ? ? ? ? ? ? y1 y2 y3 y4 y1 y2 y3 y4 13.5 ? ? ? 1.5 ? ? ? 13.5 ? ? ? 1.5 ? ? ? 13.5 ? ? ? 1.5 ? ? ? ? ? ? ? ? ? ? ? i ol1 ? ? ? ? ? ? ? 75 76 77 78 79 80 81 82 0.4 v 0.4 v ? ? ? ? 5 v gnd ? ? 0.4 v 0.4 v ? ? ? ? ? 5 v gnd ? ? ? ? ? ? ? ? ? 0.4 v 0.4 v ? ? ? ? ? ? 5 v gnd 0.4 v 0.4 v gnd ? ? ? ? ? ? 5 v 5 v ? ? ? ? ? ? ? y1 y2 y3 y4 y1 y2 y3 y4 1.6 ? ? ? 0.8 ? ? ? 1.2 ? ? ? 0.55 ? ? ? 2.1 ? ? ? 1.0 ? ? ? ma ? ? ? ? ? ? ? i ol2 ? ? ? ? ? ? ? 83 84 85 86 87 88 89 90 1.5 v 1.5 v ? ? ? ? 15 v gnd gnd gnd 1.5 v 1.5 v ? ? ? ? ? 15 v gnd gnd ? ? ? ? ? ? ? ? 1.5 v 1.5 v ? ? ? ? ? ? 15 v gnd 1.5 v 1.5 v gnd ? ? ? ? ? ? 15 v 15 v ? ? ? ? ? ? ? y1 y2 y3 y4 y1 y2 y3 y4 12.0 ? ? ? 4.5 ? ? ? 8.0 ? ? ? 3.0 ? ? ? 14.0 ? ? ? 5.5 ? ? ? ? ? ? ? ? ? ? ? see footnotes at end of device type 55. 34 mil-m-38510/55g
table iii. group a inspection for device type 55 ? continued. for terminal conditions and limits, see 1 / test limits cases a,c,d, t,x,y 1 2 3 4 5 6 7 8 9 10 11 12 13 14 subgroup 1 t c = 25 c subgroup 2 t c = 125 c subgroup 3 t c = -55 c symbol mil- std- 883 method test no. y1 y1 a1 y2 y2 a2 v ss y3 y3 a3 y4 y4 a4 v dd measured terminal min max min max min max unit i oh1 ? ? ? ? ? ? ? 91 92 93 94 95 96 97 98 4.6 v 4.6 v 5 v gnd ? ? ? ? ? ? 4.6 v 4.6 v gnd 5 v gnd ? ? gnd ? ? gnd ? ? ? ? ? ? ? 4.6 v 4.6 v gnd gnd 5 v gnd ? ? ? ? 4.6 v 4.6 v gnd gnd gnd 5 v gnd ? ? ? 5 v ? ? ? ? ? ? ? y1 y2 y3 y4 y1 y2 y3 y4 -1.4 ? ? ? -0.6 ? ? ? -1.0 ? ? ? -0.4 ? ? ? -1.75 ? ? ? -0.75 ? ? ? ma ? ? ? ? ? ? ? i oh2 ? ? ? ? ? ? ? 99 100 101 102 103 104 105 106 13.5 v 13.5 v 15 v gnd ? ? ? ? ? ? 13.5 v 13.5 v gnd 15 v gnd ? ? gnd ? ? ? ? ? ? ? ? ? ? 13.5 v 13.5 v ? ? 15 v gnd ? ? ? ? 13.5 v 13.5 v ? ? ? 15 v gnd ? ? ? 15 v ? ? ? ? ? ? ? y1 y2 y3 y4 y1 y2 y3 y4 -9.0 ? ? ? -4.0 ? ? ? -6.0 ? ? ? -2.7 ? ? ? -11.0 ? ? ? -4.8 ? ? ? ? ? ? ? ? ? ? ? i ih1 5 / 3010 107 18 v 18 v ? 18 v 18 v 18 v all inputs together 400 na i ih2 ? ? ? ? ? ? ? 108 109 110 111 18 v gnd ? ? gnd 18 v gnd gnd ? ? ? ? gnd gnd 18 v gnd gnd gnd gnd 18 v ? ? ? ? a1 a2 a3 a4 100 ? ? ? 100 ? ? ? ? ? ? ? i il1 5 / 3009 112 ? gnd ? gnd gnd ? all inputs together -400 ? i il2 ? ? ? ? ? ? ? 113 114 115 116 gnd 18 v 18 v 18 v 18 v gnd 18 v 18 v ? ? ? ? 18 v 18 v gnd 18 v 18 v 18 v 18 v gnd ? ? ? ? a1 a2 a3 a4 -100 ? ? ? -100 ? ? ? ? ? ? ? subgroup 4 t c = 25 c min max c i ? ? ? 3012 ? ? ? 117 118 119 120 a 6 / a 6 / gnd ? ? ? a 6 / a 6 / gnd ? ? ? a1 a2 a3 a4 12.0 ? ? ? pf ? ? ? see footnotes at end of device type 55. 35 mil-m-38510/55g
table iii. group a inspection for device type 55 ? continued. for terminal conditions and limits, see 1 / test limits cases a,c,d, t,x,y 1 2 3 4 5 6 7 8 9 10 11 12 13 14 subgroup 9 t c = 25 c subgroup 10 t c = 125 c subgroup 11 t c = -55 c symbol mil- std- 883 method test no. y1 y1 a1 y2 y2 a2 v ss y3 y3 a3 y4 y4 a4 v dd measured terminal min max min max min max unit t phl ? ? ? ? ? ? ? 3003 fig. 3 ? ? ? ? ? ? 121 122 123 124 125 126 127 128 out out in in out out in in gnd ? ? ? ? ? ? ? out out in in out out in in 5.0 v ? ? ? ? ? ? ? a1 to y1 a2 to y2 a3 to y3 a4 to y4 a1 to y1 a2 to y2 a3 to y3 a4 to y4 6.0 ? ? ? ? ? ? ? 115 ? ? ? ? ? ? ? 9.0 ? ? ? ? ? ? ? 172 ? ? ? ? ? ? ? 6.0 ? ? ? ? ? ? ? 115 ? ? ? ? ? ? ? ns ? ? ? ? ? ? ? t plh ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 129 130 131 132 133 134 135 136 out out in in out out in in ? ? ? ? ? ? ? ? out out in in out out in in ? ? ? ? ? ? ? ? a1 to y1 a2 to y2 a3 to y3 a4 to y4 a1 to y1 a2 to y2 a3 to y3 a4 to y4 ? ? ? ? ? ? ? ? 125 ? ? ? 110 ? ? ? ? ? ? ? ? ? ? ? 188 ? ? ? 165 ? ? ? ? ? ? ? ? ? ? ? 125 ? ? ? 110 ? ? ? ? ? ? ? ? ? ? ? t thl ? ? ? ? ? ? ? 3004 fig. 3 ? ? ? ? ? ? 137 138 139 140 141 142 143 144 out out in in out out in in ? ? ? ? ? ? ? ? out out in in out out in in ? ? ? ? ? ? ? ? y1 y2 y3 y4 y1 y2 y3 y4 ? ? ? ? ? ? ? ? 50 ? ? ? 110 ? ? ? ? ? ? ? ? ? ? ? 75 ? ? ? 165 ? ? ? ? ? ? ? ? ? ? ? 50 ? ? ? 110 ? ? ? ? ? ? ? ? ? ? ? t tlh ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 145 146 147 148 149 150 151 152 out out in in out out in in ? ? ? ? ? ? ? ? out out in in out out in in ? ? ? ? ? ? ? ? y1 y2 y3 y4 y1 y2 y3 y4 ? ? ? ? ? ? ? ? 70 ? ? ? 120 ? ? ? ? ? ? ? ? ? ? ? 105 ? ? ? 180 ? ? ? ? ? ? ? ? ? ? ? 70 ? ? ? 120 ? ? ? ? ? ? ? ? ? ? ? 1 / input pins not designated may be tied to v dd (or v cc ) or gnd or may be left open provided they do no t influence the outcome of the measurement. output pins not designated may be tied to the loads or may be left open provided they do not in fluence the outcome of the meas urement. 2 / terminal 16 is not connected for device types 53 and 54. 3 / test parameter v ic(pos) does not apply to device types 53 and 54. 4 / when performing quiescent supply current measurements (i ss ), the meter shall be placed so that all currents flow through the meter. 5 / the device manufacturer may, at his option, measure i il and i ih at 25 c for each individual input or measure all inputs together. 6 / (a) capacitance bridge between measured terminal and v ss ; frequency = 1 mhz. 7 / test limits t phl , t plh , t thl , and t tlh for device types 51/53 and 52/54 consists of two sets of values and are expressed xxx/xxxx in the limits column. the digits preceding the slash apply to the first device in a set. 36 mil-m-38510/55g
mil-m-38510/55g 37 4.4.4 group d inspection. group d inspection shall be in accordance with table v of mil-prf-38535. end-point electrical parameters shall be as specified in table ii herein. 4.4.5 group e inspection . group e inspection is required only for parts intended to be marked as radiation hardness assured (see 3.7 herein). rha levels for device classes b and s shall be as specified in mil-prf-38535 and 4.5.4 herein. 4.5 methods of inspection. methods of inspection shall be specified and as follows: 4.5.1 voltage and current. unless otherwise specified, all voltages given are referenced to the microcircuit v ss terminal. currents given are conventional current and positive when flowing into the referenced terminal. 4.5.2 burn-in and life test cool down procedures . when the burn-in and life tests are completed and prior to removal of bias voltages, the devices under test (dut ) shall be cooled to a temperature of 25 c 3 c; then, electrical parameter end- point measurements shall be performed. table iv. delta limits at 25 c . device types parameter 1 / 01-05 51-55 i ss 20 na 20 na v ol1 0.04 v v oh1 0.08 v i ol1 15% i oh1 15% 1 / each of the above parameters shall be recorded before and after t he required burn-in and life tests to determine delta ( ? ). 4.5.3 quiescent supply current (i ss test) . when performing quiescent supply current measurements (i ss ), the meter shall be placed so that all currents flow through the meter. 4.5.4 radiation hardness assurance (rha) testing . the rha testing shall be performed in accordance with test procedures and sampling specifi ed in mil-prf-38535 and herein. a. before irradiation, selected samp les shall be assembled in qualified packages and pass the governing electrical parameters (group a subgroup 1 at 25 c) and also be subjected to the threshold-voltage test in table vii in order to calculate the delta threshold ( ? v t ) after irradiation. b. the devices shall be subjected to a total radiati on dose as specified in mil-prf-38535 for the radiation hardness assurance level being tested, and meet the end-point electrical parameters as defined in table v at 25 c, after exposure. the start and completion of the en d-point electrical parameter measurements shall not exceed 2 hours following irradiation. c. threshold-voltage test circuit conditions shall be as s pecified in table vii and on figure 4. in situ and remote testing, the tests shall be performed with the devices biased in accordance with table vi and the bias may be interrupted for up to 1 minute to remove devices to the remote bias fixture. d. after irradiation, the devices shall pass the truth table test as specified in subgroup 7 in table iii or if subgroup 7 is not required, then an equivalent tr uth table test shall be performed.
mil-m-38510/55g 38 table v. radiation hardened end-point electrical parameters at 25 c . v dd device types parameter all device types 01-05 51-55 v tn v tp ? v t i ss t plh t phl 0.3 v min 2.8 v max 1.4 v max 100 x max limit 1.35 x max limit 1.35 x max limit 10 v 10 v 10 v 15 v 5 v 5 v 10 v 10 v 10 v 18 v 5 v 5 v table vi. bias during exposure to radiation . pin connections 1 / device type v dd = 10 v dc (through a 30 k ? to 60 k ? resistor) v ss = gnd v cc and v dd = 10 v dc 01, 51 3, 5, 7, 9, 11, 14 8 1, 16 02, 52 3, 5, 7, 9, 11, 14 8 1, 16 03, 53 3, 5, 7, 9, 11, 14 8 1 04, 54 3, 5, 7, 9, 11, 14 8 1 05, 55 3, 6, 10, 13 7 14 1 / pins not designated are open, or tied to 10 v dc through a 30 k ? to 60 k ? resistor. 5. packaging 5.1 packaging . for acquisition purposes, the packaging requirements are as specified in the contract or order (see 6.2). when packaging of materiel is to be performed by dod or in-house contractor personnel, these personnel need to contact the responsible packaging activity to ascertain packaging requirements. packaging requirements are maintained by the inventory control point?s packaging activity within t he military service or defense ag ency, or within the military service?s system commands. packaging data retrieval is availa ble from the managing military department?s or defense agency?s automated packaging files, cd- rom products, or by contacting the responsible packaging activity.
mil-m-38510/55g 39 figure 4. threshold-voltage test circuit . table vii. threshold-voltage test circuit conditions . v tn measured at v tp measured at device gnd 10 v -20 a supply -10 a supply gnd -10 v 20 a supply 10 a supply 01, 51 3 1, 16 5, 7, 8, 9, 11, 14 3 5, 7, 8, 9, 11, 14 1, 16 02, 52 3 1, 16 5, 7, 8, 9, 11, 14 3 5, 7, 8, 9, 11, 14 1, 16 03, 53 3 1 5, 7, 8, 9, 11, 14 3 5, 7, 8, 9, 11, 14 1 04, 54 3 1 5, 7, 8, 9, 11, 14 3 5, 7, 8, 9, 11, 14 1 05, 55 3 14 6, 7, 10, 13 3 6, 7, 10, 13 14
mil-m-38510/55g 40 6. notes (this section contains information of a general or explan atory nature that may be helpful, but is not mandatory.) 6.1 intended use. microcircuits conforming to this specification ar e intended for original equipment design applications and logistic support of existing equipment. 6.2 acquisition requirements. acquisition documents should specify the following: a. title, number, and date of the specification. b. pin and compliance identifier, if applicable (see 1.2). c. requirements for delivery of one copy of the quality conformance insp ection data pertinent to the device inspection lot to be supplied with each shipment by the device manufacturer, if applicable. d. requirements for certificate of compliance, if applicable. e. requirements for notification of change of product or process to contractin g activity in addition to notification to the qualifying activity, if applicable. f. requirements for failure analysis (including required test condition of method 5003 of mil-std-883), corrective action, and reporting of results, if applicable. g. requirements for product assurance an d radiation hardness assurance options. h. requirements for special carriers, lead lengths, or lead forming, if applicable. these requirements should not affect the part number. unless otherwi se specified, these requirements will not apply to direct purchase by or direct shipment to the government. i. requirements for "jan" marking. j. packaging requirements. (see 5.1) 6.3 superseding information . the requirements of mil-m-38510 have be en superseded to take advantage of the available qualified manufacturer listing (qml) system prov ided by mil-prf-38535. previous references to mil-m-38510 in this document have been replaced by appropriate references to mil-prf-38535. all technical requirements now consist of this specification and mil-prf-385 35. the mil-m-38510 specification s heet number and pin have been retained to avoid adversely impacting existing government logistics systems and contractors parts lists. 6.4 qualification . with respect to products requiring qualification, aw ards will be made only for products which are, at the time of award of contract, qualified for inclusion in qu alified manufacturers list qm l-38535 whether or not such products have actually been so listed by th at date. the attention of the contract ors is called to these requirements, and manufacturers are urged to arrange to have the products that they propose to offer to the federal government tested for qualification in order that they may be eligible to be awarded contracts or purchase orders for the products covered by this specification. information pertaining to qualification of products may be obtained from dscc-vq, p.o. box 3990, columbus, ohio 43218-3990. 6.5 abbreviations, symbols, and definitions. the abbreviations, symbols, and definitions used herein are defined in mil-prf-38535, mil-hdbk-1331, and as follows: c i ................................................. input te rminal-to-gnd capacitance. gnd ............................................ gr ound zero voltage potential. t a ................................................ free air temperature. i dd and i cc .................................... dc supply current. i gnd .............................................. dc gr ound current. i ss ................................................ quiesc ent supply current. v dd ............................................... positi ve supply voltage. v ic (pos)........................................ posi tive clamping input to v dd. v ic (neg) ....................................... negative clamping input to v ss. v ss ............................................... n egative supply voltage.
mil-m-38510/55g 41 6.6 logistic support. lead materials and finishes (see 3.4) are in terchangeable. unless otherwise specified, microcircuits acquired for government logistic support will be acquired to device class s for national aeronautics and space administration or class b for department of defense (see 1.2.2), lead material and finish a (see 3.4). longer length leads and lead forming will not affect the part number. 6.7 data reporting . when specified in the purchase order or contract, a copy of the following data, as applicable, will be supplied. a. attributes data for all screening tests (see 4.2) and variables data for a ll static burn-in, dynamic burn-in, and steady-state life tests (see 3.6). b. a copy of each radiograph. c. the technology conformance inspection (tci) data (see 4.4). d. parameter distribution data on paramet ers evaluated during burn-in (see 3.6). e. final electrical parameters data (see 4.2d). f. rha delta limits. 6.8 substitutability. the cross-reference information below is present ed for the convenience of users. microcircuits covered by this specification will functiona lly replace the listed generic-industry ty pe. generic-industry microcircuit types may not have equivalent operational performance characterist ics across military temperatur e ranges, post irradiation performance or reliability factors equivalent to mil-m-38510 devic e types and may have slight physical variations in relation to case size. the presence of this information should not be deemed as permitting substitution of generic-industry types for mil-m-38510 types or as a waiver of any of the provisions of mil-prf-38535. military device type generic-industry type 01 4009a 02 4010a 03 4049a 04 4050a 05 4041a 51 4009ub 52 4010b 53 4049ub 54 4050b 55 4041ub 6.9 changes from previous issue . marginal notations are not used in this revision to identify changes with respect to the previous issue due to the extent of the changes. custodians: preparing activity: army - cr dla - cc navy - ec air force - 11 (project 5962-2066) dla - cc review activities: army - mi, sm navy - as, cg, mc, sh, td air force ? 03, 19, 99 note: the activities listed above were interested in this do cument as of the date of this document. since organizations and responsibilities can change, you should verify the curre ncy of the information above using assist online database at http://assist.daps.dla.mil .

▲Up To Search▲

Price & Availability of M3851005503BEA

	To Download M3851005503BEA Datasheet File
If you can't view the Datasheet, Please click here to try to view without PDF Reader .